Scanning Auger microscopy, surface

Auger spectroscopy can also be used in a scanning mode (scanning Auger microscopy, or SAM) to yield surface topographical and elemental distribution data (30). 

Electrons Auger Electron Spectroscopy, Extended X-Ray Absorption Fine Structure, Low-Energy Electron Diffraction, Scanning Electron Microscopy, Surface Extended X-Ray Absorption Fine Structure, Ultraviolet Photoelectron Spectroscopy, X-Ray Absorption Near Edge Fine Structure, and X-Ray Photon Spectroscopy. 

Finally, the surface and bulk compositions of these fibers can vary dramatically. Figures 5 and 6 show the scanning Auger microscopy (SAM) profiles of SGN and HPZ ceramic fibers, respectively. Because the fiber-matrix interfaces are critical in many applications (2), this type of characterization of fiber surface composition and chemistry must be carried out. 

Unlike Ni(lll), Ag(lll) surfaces flashed repeatedly (ca. 20 times) to high temperature (1000 K) or aimealed at high temperature developed white (or cloudy) areas as judged by a visual inspection at appropriate angles of incidence. Analysis of such surfaces with optical microscopy and scanning Auger microscopy indicated that this effect was purely structural, involving pits and other asperities with characteristic dimensions of about... 

Formation of nanopores are directly observed by scanning Auger microscopy (SAM) data for that surface region [5]. From SEM and SAM images taken from same area, after SiN nanonetwork deposition, nanometer scale pores without Si were observed, and the area between GaN islands was indeed covered by SiN. Meanwhile, the density of nanopores was probably much larger than nucleation density. 

Figure 9. Scanning auger microscopy (SAM) maps and surface profile trace for PTFE wear film on an Iridium substrate. Load, 2 newtons temperature, 24 C sliding speed, 0.1 mm per second.

RNRA, Resonant Nuclear Reaction Analysis, 35 RS Recoil Spectrometry, viz ERDA, 9 SALI Surface Analysis by Laser Ionisation, 39 SAM Scanning Auger Microscopy, 37... 

Inductively Coupled Plasma. Mass Spectrometry Archaeological Applications. Microscopy Techniques Scanning Electron Microscopy. Surface Analysis X-Ray Photoelectron Spectroscopy Particle-Induced X-Ray Emission Auger Electron Spectroscopy. X-Ray Absorption and Diffraction X-Ray Diffraction - Powder. X-Ray Fluorescence and Emission X-Ray Fluorescence Theory. 

See also Microscopy Techniques Atomic Force and Scanning Tunneiing Microscopy. Surface Ana-iysis X-Ray Photoeiectron Spectroscopy Auger Eiec-tron Spectroscopy ion Scattering. X-Ray Absorption and Diffraction X-Ray Absorption. X-Ray Fiuorescence and Emission X-Ray Diffraction - Singie Crystai. 

In Scanning Auger Microscopy (SAM), a focussed electron beam is scanned across a surface to produce Auger electrons and the results are presented as a map on X and Y axes showing the surface distribution of a particular element. Other workers [49-52] have used SAM to determine the distribution of oxygen on the surface of carbon fibers and the structure of the interface in carbon fiber composites [53]. 

ABSTRACT. The paper details the use of scanning electron microscopy, surface reflectance infrared spectroscopy, Auger electron spectroscopy, ion scattering spectroscopy, secondary ion mass spectroscopy, and x-ray photoelectron spectroscopy in the analysis of polymeric adhesives and composites. A brief review of the principle of each surface analytical technique will be followed by application of the technique to interfacial adhesion with an emphasis on polymer/metal, fiber/matrix, and composite/composite adhesion. 

---