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Nanoindentation surface force microscopy

Asif, S.A.S., Wahl, K.J. and Colton, R.J., The influence of oxide and adsorbates on the nanomechanical response of silicon surfaces. J. Mater. Res., 15,546-553 (2000). Bhushan, B., Kulkami, A.V., Bonin, W. and Wyrobek, J.T., Nanoindentation and picoin-dentation measurements using a capacitive transducer system in atomic force microscopy. Philos. Mag. A Phys. Condens. Matter Struct. Defects Mech. Prop., 74(5), 1117-1128 (1996). [Pg.220]

K. Miyake, N. Satomi, S. Sasaki, Elastic modulus of polystyrene film from near surface to bulk measured by nanoindentation using atomic force microscopy. Appl. Phys. Lett. 89(3), 031925 (2006)... [Pg.144]

L, and Morita, S. (2006) Non-contact atomic force microscopy study of atomic manipulation on an insulator surface by nanoindentation. Nanotechnology, 17, S142-S147. [Pg.486]

Polymer/fiber composites were evaluated via tapping mode morphology analysis, adhesive force and nanoindentation scanning probe microscopy techniques. Composite samples showed substantial differences in morphology, related to the resin composition and the manufacturing release technology. Differences in adhesive force and reduced modulus were observed that were dependent primarily on polymer resin composition. These analytical techniques show promise for identifying subtle differences in surface properties for composite samples, and justify further development for... [Pg.2428]

Many techniques have been developed to measure the Young s modulus and the stress of the mesoscopic systems [12, 13]. Besides the traditional Vickers microhardness test, techniques mostly used for nanostructures are tensile test using an atomic force microscope (AFM) cantilever, a nanotensile tester, a transmission electron microscopy (TEM)-based tensile tester, an AFM nanoindenter, an AFM three-point bending tester, an AFM wire free-end displacement tester, an AFM elastic-plastic indentation tester, and a nanoindentation tester. Surface acoustic waves (SAWs), ultrasonic waves, atomic force acoustic microscopy (AFAM), and electric field-induced oscillations in AFM and in TEM are also used. Comparatively, the methods of SAWs, ultrasonic waves, field-induced oscillations, and an AFAM could minimize the artifacts because of their nondestructive nature though these techniques collect statistic information from responses of all the chemical bonds involved [14]. [Pg.443]

We denote it as in this appendix (H in the main text) in order to compare microhardness p and nanohardness H as extracted from nanoindentation curves. As discussed in detail, p and H may differ. Macro-, micro- and nanoindentation domains have been defined and hardness values are to be compared in the respective domain since an ISE is reported for many types of materials (Gao et al., 1999 Sangwal, 2000 Elmustafo and Stone, 2003). In the macro- and microindentation domains, the surface is generally determined after unloading by optical microscopy. We shall refer to this area as Ap (projected area defined above). Going to the nanoindentation domain, hardness is determined under load and is defined as the ratio of the force to the projected contact area Ac (Section H.l) ... [Pg.340]


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