Scanning surface confocal microscopy

Scanning ion conductance microscopy has been incorporated into a variety of non-electrochemical techniques to impart topographic imaging capabilities or improved probe control. Integration of SICM with confocal microscopy has enabled the development of an SPM technique called scanning surface confocal microscopy... 

D. Krauzewicz, N. Korchev, Y., Scanning surface confocal microscopy for simultaneous topographical and fluorescence imaging Application to single virus-like particle entry into a cell. Proceedings of the National Academy of Sciences 2002, 99, 16018-16023. 

E., Imaging single virus particles on the surface of cell membranes by high-resolution scanning surface confocal microscopy. Biophysical Journal 2008, 94,4089-4094. 

Shevchuk, A. L Hobson, R Klenerman, D. Krauzewicz, N. Korchev, Y. E., Endocytic pathways Combined scanning ion conductance and surface confocal microscopy study. Pfliigers Archiv-European Journal of Physiology 2008, 456, 227-235. 

Silver and gold nanoparticles were generated electrochemically and investigated with confocal Raman microscopy. The combination of surface-enhanced Raman spectroscopy with confocal microscopy accompanied by subsequent scanning electron microscopy provided an image of the geometrical stmcture of the Raman spots. 

On the other hand, optical microscopy, confocal microscopy, ellipsometry, scanning electron microscopy (SEM), scanning tunneling microscopy (STM), atomic force microscopy (AFM) and total internal reflection fluorescence (TIRF) are the main microscopic methods for imaging the surface structure. There are many good books and reviews on spectroscopic and chemical surface analysis methods and microscopy of surfaces description of the principles and application details of these advanced instrumental methods is beyond the scope of this book. 

Fig. 9 Microstructured evaporating surface for thin film evaporation (3D photo of surface using 3D laser scanning confocal microscopy, Olympus Corporation) [14]...

A wide range of techniques can be used to capture the surface roughness of a component using noncontact methods. Some of the more common instruments used to captore topographic data include confocal microscopy, laser triangulation, focus detection, and optical interferometry. A relatively recent branch of microscopy known as scanning probe microscopy (SPM) yields over 20 other instruments which are defined based on what probe-surface interaction they are monitoring. The SPM family is described in more detail elsewhere in this book and will be briefly mentioned in this article. 

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