Transmission electron microscopy nanostructured material surfaces

X-ray diffraction technique is a non-destructive analytical technique that reveals information about crystallographic structure, chemical composition and physical properties of nanostructured materials. UV/Vis spectroscopy is routinely used in the quantitative determination of films of nanostructured metal oxides. The size, shape (nanocomb and nanorods etc,) and arrangement of the nanoparticles can be observed through transmission electron microscope (TEM) studies. Surface morphology of nanostructured metal oxides can be observed in atomic force microscopy (AFM) and scanning electron microscopy (SEM) studies. 

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