Scanning tunneling microscopy, surface

Binnig G., and Rohrer, H. (1983). Scanning tunneling microscopy. Surface Science. 126, 236-244. 

The ability to control the position of a fine tip in order to scan surfaces with subatomic resolution has brought scanning probe microscopies to the forefront in surface imaging techniques. We discuss the two primary techniques, scanning tunneling microscopy (STM) and atomic force microscopy (AFM) the interested reader is referred to comprehensive reviews [9, 17, 18]. 

Since scanning tunneling microscopy requires flat conducting surfaces, it is not surprising that most of its early application was to study inorganic materials [17, 19, 20, 29-34]. These studies include investigations of catalytic metal surfaces [24, 35-37], silicon and other oxides [21], superconductors [38], gold... 

Fig. VIII-2. Scanning tunneling microscopy images illustrating the capabilities of the technique (a) a 10-nm-square scan of a silicon(lll) crystal showing defects and terraces from Ref. 21 (b) the surface of an Ag-Au alloy electrode being electrochemically roughened at 0.2 V and 2 and 42 min after reaching 0.70 V (from Ref. 22) (c) an island of CO molecules on a platinum surface formed by sliding the molecules along the surface with the STM tip (from Ref. 41).

STM Scanning tunneling microscopy [9, 19, 31] Tunneling current from probe scans a conducting surface Surface structure... 

We have considered briefly the important macroscopic description of a solid adsorbent, namely, its speciflc surface area, its possible fractal nature, and if porous, its pore size distribution. In addition, it is important to know as much as possible about the microscopic structure of the surface, and contemporary surface spectroscopic and diffraction techniques, discussed in Chapter VIII, provide a good deal of such information (see also Refs. 55 and 56 for short general reviews, and the monograph by Somoijai [57]). Scanning tunneling microscopy (STM) and atomic force microscopy (AFT) are now widely used to obtain the structure of surfaces and of adsorbed layers on a molecular scale (see Chapter VIII, Section XVIII-2B, and Ref. 58). On a less informative and more statistical basis are site energy distributions (Section XVII-14) there is also the somewhat laige-scale type of structure due to surface imperfections and dislocations (Section VII-4D and Fig. XVIII-14). 

We confine ourselves here to scanning probe microscopies (see Section VIII-2B) scanning tunneling microscopy (STM) and atomic force microscopy (AFM), in which successive profiles of a surface (see Fig. VIII-1) are combined to provide a contour map of a surface. It is conventional to display a map in terms of dark to light areas, in order of increasing height above the surface ordinary contour maps would be confusing to the eye. 

Rohrer G 1993 The preparation of tip and sample surfaces for STM experiments Scanning Tunnelling Microscopy and Spectroscopy ed D A Bonnell (Weinheim VCH) ch 6... 

Winterlin J and Behm R J 1994 Adsorbate covered metal surfaces and reactions on metal surfaces Scanning Tunnelling Microscopy I ed R Wiesendanger and H-J Guntherodt (Berlin Springer) ch 4... 

Ohtani H, Wilson R J, Chiang S and Mate C M 1988 Scanning tunnelling microscopy observations of benzene molecules on the Rh(111)-(3 3) (CgHg + 2CO) surface Rhys. Rev. Lett. 60 2398... 

Yuan J-Y, Shao Z and Gao C 1991 Alternative method of imaging surface topologies of nonconducting bulk specimens by scanning tunnelling microscopy Phys. Rev. Lett. 67 863... 

Staufer U 1995 Surface modification with a scanning proximity probe microscope Scanning Tunnelling Microscopy II ed R Wiesendanger and Fl-J Guntherodt (Beriin Springer) ch 8... 

Pethica J B 1986 Comment on interatomic forces in scanning tunnelling microscopy giant corrugations of the graphite surface Phys. Rev. Lett. 57 3235... 

A wide variety of measurements can now be made on single molecules, including electrical (e.g. scanning tunnelling microscopy), magnetic (e.g. spin resonance), force (e.g. atomic force microscopy), optical (e.g. near-field and far-field fluorescence microscopies) and hybrid teclmiques. This contribution addresses only Arose teclmiques tliat are at least partially optical. Single-particle electrical and force measurements are discussed in tire sections on scanning probe microscopies (B1.19) and surface forces apparatus (B1.20). 

Matsumoto H, Inukai J and Ito M 1994 Structures of copper and halides on Pt(111), Pt(IOO) and Au(111) electrode surfaces studied by in situ scanning tunneling microscopy J. Eiectroanai. Chem. 379 223-31... 

The dangling bonds of a Si surface abstract one F atom from an incident F2 molecule while the complementary F atom is scattered back into the gas phase [20]. This abstractive mechanism leads to F adsorjDtion at single sites rather than at adjacent pairs of sites, as observed directly by scanning tunnelling microscopy [21]. Br atoms adsorb only to Ga atoms in the second layer of GaAs(001)-(2 x 4) where empty dangling bonds on the Ga atoms can be filled by electrons from the Br atoms [22]. 

Ph. Ebert, B. Engels, P. Richard, K. Schroeder, S. Bluegel, C. Domke, M. Heinrich, K. Urban. Contribution of surface resonances to scanning tunneling microscopy images (110) surfaces of III-V semiconductors. Phys Rev Lett 77 2997, 1996. 

The very new techniques of scanning tunnelling microscopy (STM) and atomic force microscopy (AFM) have yet to establish themselves in the field of corrosion science. These techniques are capable of revealing surface structure to atomic resolution, and are totally undamaging to the surface. They can be used in principle in any environment in situ, even under polarization within an electrolyte. Their application to date has been chiefly to clean metal surfaces and surfaces carrying single monolayers of adsorbed material, rendering examination of the adsorption of inhibitors possible. They will indubitably find use in passive film analysis. 

Film-forming chemical reactions and the chemical composition of the film formed on lithium in nonaqueous aprotic liquid electrolytes are reviewed by Dominey [7], SEI formation on carbon and graphite anodes in liquid electrolytes has been reviewed by Dahn et al. [8], In addition to the evolution of new systems, new techniques have recently been adapted to the study of the electrode surface and the chemical and physical properties of the SEI. The most important of these are X-ray photoelectron spectroscopy (XPS), SEM, X-ray diffraction (XRD), Raman spectroscopy, scanning tunneling microscopy (STM), energy-dispersive X-ray spectroscopy (EDS), FTIR, NMR, EPR, calorimetry, DSC, TGA, use of quartz-crystal microbalance (QCMB) and atomic force microscopy (AFM). 

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