Scanning surface potential microscopy

Many-pass techniques Electric Force Microscopy (EFM) Scanning Capacitance Microscopy (SCaM) Kelvin Probe Microscopy (SKM) DC Magnetic Force Microscopy (DC MFM) AC Magnetic Force Microscopy (AC MFM) Dissipation Force Microscopy-Scanning Surface Potential Microscopy (SSPM) Scanning Maxwell Stress Microscpy (SMMM) Magnetic Force Microscopy (MFM) Van der Waals Force Microscopy (VDWFM)... 

While the previously described techniques both require extrapolation of measured data in order to calculate the contact resistance, Kelvin probe force microscopy (KFM, also known as scanning surface potential microscopy or scanning potenti-ometry) can be used to determine the source and drain contributions to the contact resistance directly. In KFM, a conductive atomic force microscope (AFM) tip is scanned over the operational OFET channel twice. On the first pass, the topography... 

H. Kawate, Scanning Surface Potential Microscopy for Local Surface Analysis, M. Eng. Thesis, Tokyo Institute of Technology, Yokohama, 1993... 

C. Electric Force Microscopy (EFM) and Scanning Surface Potential Microscopy (SSPM)... 

An unusually extensive battery of experimental techniques was brought to bear on these comparisons of enantiomers with their racemic mixtures and of diastereomers with each other. A very sensitive Langmuir trough was constructed for the project, with temperature control from 15 to 40°C. In addition to the familiar force/area isotherms, which were used to compare all systems, measurements of surface potentials, surface shear viscosities, and dynamic suface tensions (for hysteresis only) were made on several systems with specially designed apparatus. Several microscopic techniques, epi-fluorescence optical microscopy, scanning tunneling microscopy, and electron microscopy, were applied to films of stearoylserine methyl ester, the most extensively investigated surfactant. 

Scanning tunnelling microscopy, scanning electrochemical microscopy, and AFM-surface potential measurements have also been used to investigate Nafion films. Scanning electrochemical microscopy reveals a domain-like structure containing circular features ca. 1-2 nm in diameter made up of a conductive center (presumed to be ion-rich regions) surrounded by a much less conductive zone. " Atomic force microscopy surface potential measurements detect features that were interpreted as ion channels in Nafion membranes. The size of the claimed ion channels was... 

A further spatially resolved method, also based on work function contrast, is scanning Kelvin probe microscopy (SKPM). As an extended version of atomic force microscopy (AFM), additional information on the local surface potential is revealed by a second feedback circuit. The method delivers information depending on the value (p (p(x) + A x). Here, A(zS(x) is the difference in work function between the sample and the AFM tip and cp(x) is the local electric potential [12]. (p x) itself gives information on additional surface charges due to... 

Friction and adhesive forces have been used widely as measurable properties [67], which can be obtained easily by SPM (Scanning Probe Microscopy) as described above. However, other properties such as surface potentials or contact potential difference (CPD) [29, 58-62], phases in tapping mode AFM [68, 69], and fluorescence intensities under SNOM [70-76] can be used for CFM [17,67,77]. 

Electrical Force Microscopy (EFM) can provide surface potential and charge distribution maps to a spatial resolution of a couple of nanometers. Information is derived by scanning an atomically sharp tip over the surface of interest and measuring the deflection resulting from the electrostatic force. This is sometimes termed... 

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