Substrate/surface characterization microscopy

The substrate surface smoothness is critical to TFT performance. Device fabrication processes basically duplicate and/or worsen the surface roughness, which leads to smaller pentacene grains and results in deterioration of pentacene channel mobility. Atomic-force microscopy was used to characterize the surface roughness. Figure 15.21 shows an AFM image of our PET substrate surface before any process. The mean-square roughness and peak-to-valley roughness are 10 A and 90 A,... 

Atomic force microscopy is a powerful method for surface characterization. It is based on an interaction between a tip mounted to a cantilever and the substrate. The latter is systematically scanned to obtain a three-dimensional picture of its surface (Figure 3.105). Contrary to other methods in high-resolution microscopy, the samples can be examined at ambient conditions, and even nonconducting materials do not require coating with a metallic conductor, so the effort for sample preparation is markedly reduced. 

From a methodological point of view, of particularly interest have been improvements in the chemical sensitivity of STM and AFM characterization. This is especially desirable for electrochemists, as electrochemical environments prevent the combined characterization by other surface techniques, as are frequently used for composition determinations in vacuum. Tunneling spectroscopy measurements to obtain 7 y and d//dV y relationships may provide a certain degree of information regarding the electronic structure of the substrate surface and adsorbed molecules [77], and the use of ionic liquids of large electrochemical windows is favorable in this respect. One major enhancement would be to complement SPM with other spatial, time- and energy-resolved surface in-situ techniques. For example, a combination of scanning electrochemical microscopy and atomic force microscopy... 

Monolayers of alkanetliiols adsorbed on gold, prepared by immersing tire substrate into solution, have been characterized by a large number of different surface analytical teclmiques. The lateral order in such layers has been investigated using electron [1431, helium [144, 1451 and x-ray [146, 1471 diffraction, as well as witli scanning probe microscopies [122, 1481. Infonnation about tire orientation of tire alkyl chains has been obtained by ellipsometry [149], infrared (IR) spectroscopy [150, 151] and NEXAFS [152]. 

Substrate Characterization. Test coupons and panels of 7075-T6 aluminum, an alloy used extensively for aircraft structures, were degreased In a commercial alkaline cleaning solution and rinsed In distilled, deionized water. The samples were then subjected to either a standard Forest Products Laboratories (FPL) treatment ( 0 or to a sulfuric acid anodization (SAA) process (10% H2SO4, v/v 15V 20 min), two methods used for surface preparation of aircraft structural components. The metal surfaces were examined by scanning transmission electron microscopy (STEM) In the SEM mode and by X-ray photoelectron spectroscopy (XPS). 

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