Fast atom

A connnon feature of all mass spectrometers is the need to generate ions. Over the years a variety of ion sources have been developed. The physical chemistry and chemical physics communities have generally worked on gaseous and/or relatively volatile samples and thus have relied extensively on the two traditional ionization methods, electron ionization (El) and photoionization (PI). Other ionization sources, developed principally for analytical work, have recently started to be used in physical chemistry research. These include fast-atom bombardment (FAB), matrix-assisted laser desorption ionization (MALDI) and electrospray ionization (ES). 

FigureBl.7.2. Schematic representations of alternative ionization methods to El and PI (a) fast-atom bombardment in which a beam of keV atoms desorbs solute from a matrix (b) matrix-assisted laser desorption ionization and (c) electrospray ionization.

Barber N, Bordoll R S, Elliot G J, Sedgwiok R D and Tyler A N 1982 Fast atom bombardment mass speotrometry Anal. Chem. 54 645A-57A... 

Fast-Atom Bombardment (FAB) and Liquid-Phase Secondary Ion Mass Spectrometry (LSIMS) Ionization... 

A big step forward came with the discovery that bombardment of a liquid target surface by abeam of fast atoms caused continuous desorption of ions that were characteristic of the liquid. Where this liquid consisted of a sample substance dissolved in a solvent of low volatility (a matrix), both positive and negative molecular or quasi-molecular ions characteristic of the sample were produced. The process quickly became known by the acronym FAB (fast-atom bombardment) and for its then-fabulous results on substances that had hitherto proved intractable. Later, it was found that a primary incident beam of fast ions could be used instead, and a more generally descriptive term, LSIMS (liquid secondary ion mass spectrometry) has come into use. However, note that purists still regard and refer to both FAB and LSIMS as simply facets of the original SIMS. In practice, any of the acronyms can be used, but FAB and LSIMS are more descriptive when referring to the primary atom or ion beam. 

Instead of the fast-atom beam, a primary ion-beam gun can be used in just the same way. Generally, such an ion gun emits a stream of cesium ions (Cs ), which are cheaper to use than xenon but still have large mass (atomic masses Cs, 139 Xe, 131). Although ion guns produce no fragment ions in the primary beam, they can contaminate the mass spectrometer by deposition with continued use. 

A typical cascade process. A fast atom or ion collides with surface molecules, sharing its momentum and causing the struck molecules to move faster. The resulting fast-moving particles then strike others, setting up a cascade of collisions until all the initial momentum has been redistributed. The dots ( ) indicate collision points, tons or atoms (o) leave the surface. 

By using a beam of fast atoms or ions incident onto a nonvolatile liquid containing a sample substance, good molecular or quasi-molecular positive and/or negative ion peaks can be observed up to about 4000-5000 Da. Ionization is mild, and, since it is normally carried out at 25-35°C, it can be used for thermally labile substances such as peptides and sugars. 

The basic principles of fast-atom bombardment (FAB) and liquid-phase secondary ion mass spectrometry (LSIMS) are discussed only briefly here because a fuller description appears in Chapter 4. This chapter focuses on the use of FAB/LSIMS as part of an interface between a liquid chromatograph (LC) and a mass spectrometer (MS), although some theory is presented. 

Bombardment of a liquid surface by a beam of fast atoms (or fast ions) causes continuous desorption of ions that are characteristic of the liquid. Where the liquid is a solution of a sample substance dissolved in a solvent of low volatility (often referred to as a matrix), both positive and negative ions characteristic of the solvent and the sample itself leave the surface. The choice of whether to examine the positive or the negative ions is effected simply by the sign of an electrical potential applied to an extraction plate held above the surface being bombarded. Usually, few fragment ions are observed, and a sample of mass M in a solvent of mass S will give mostly [M + H] (or [M - H] ) and [S -I- H]+ (or [S - H] ) ions. Therefore, the technique is particularly good for measurement of relative molecular mass. 

A gun is used to direct a beam of fast atoms (often Xe) or fast ions (often Cs+) onto a small metal target area where the solution of interest is placed. Production of an atom beam is described in Figure 13.1. 

In dynamic FAB, this solution is the eluant flowing from an LC column i.e., the target area is covered by a flowing liquid (dynamic) rather than a static one, as is usually the case where FAB is used to examine single substances. The fast atoms or ions from the gun carry considerable momentum, and when they crash into the surface of the liquid some of this momentum is transferred to molecules in the liquid, which splash back out, rather like the result of throwing a stone into a pond (Figure 13.2). This is a very simplistic view of a complex process that also turns the ejected particles into ions (see Chapter 4 for more information on FAB/LSIMS ionization). 

Liquids examined by FAB are introduced into the mass spectrometer on the end of a probe inserted through a vacuum lock in such a way that the liquid lies in the target area of the fast atom or ion beam. There is a high vacuum in this region, and there would be little point in attempting to examine a solution of a sample in one of the commoner volatile solvents such as water or dichloromethane because it would evaporate extremely quickly, probably as a burst of vapor when introduced into the vacuum. Therefore it is necessary to use a high-boiling solvent as the matrix material, such as one of those listed in Table 13.1. 

By passing a continuous flow of solvent (admixed with a matrix material) from an LC column to a target area on the end of a probe tip and then bombarding the target with fast atoms or ions, secondary positive or negative ions are ejected from the surface of the liquid. These ions are then extracted into the analyzer of a mass spectrometer for measurement of a mass spectrum. As mixture components emerge from the LC column, their mass spectra are obtained. 

The LC/TOF instmment was designed specifically for use with the effluent flowing from LC columns, but it can be used also with static solutions. The initial problem with either of these inlets revolves around how to remove the solvent without affecting the substrate (solute) dissolved in it. Without this step, upon ionization, the large excess of ionized solvent molecules would make it difficult if not impossible to observe ions due only to the substrate. Combined inlet/ionization systems are ideal for this purpose. For example, dynamic fast-atom bombardment (FAB), plas-maspray, thermospray, atmospheric-pressure chemical ionization (APCI), and electrospray (ES)... 

Some mild methods of ionization (e.g., chemical ionization. Cl fast-atom bombardment, FAB electrospray, ES) provide molecular or quasi-molecular ions with so little excess of energy that little or no fragmentation takes place. Thus, there are few, if any, normal fragment ions, and metastable ions are virtually nonexistent. Although these mild ionization techniques are ideal for yielding molecular mass information, they are almost useless for providing details of molecular structure, a decided disadvantage. 

This method is still in use but is not described in this book because it has been superseded by more recent developments, such as particle beam and electrospray. These newer techniques have no moving parts, are quite robust, and can handle a wide variety of compound types. Chapters 8 through 13 describe these newer ionization techniques, including electrospray, atmospheric pressure ionization, plasmaspray, thermospray, dynamic fast-atom bombardment (FAB), and particle beam. 

To achieve sufficient vapor pressure for El and Cl, a nonvolatile liquid will have to be heated strongly, but this heating may lead to its thermal degradation. If thermal instability is a problem, then inlet/ionization systems need to be considered, since these do not require prevolatilization of the sample before mass spectrometric analysis. This problem has led to the development of inlet/ionization systems that can operate at atmospheric pressure and ambient temperatures. Successive developments have led to the introduction of techniques such as fast-atom bombardment (FAB), fast-ion bombardment (FIB), dynamic FAB, thermospray, plasmaspray, electrospray, and APCI. Only the last two techniques are in common use. Further aspects of liquids in their role as solvents for samples are considered below. 

FAB has evolved, and fast atoms are being replaced by fast ions, such as cesium (Cs+). This variation is called liquid secondary ion mass spectrometry (LSIMS) because the sample solution affords the secondary ion beam while the bombarding ions constitute the primary beam. Spectra... 

In fast-atom bombardment (FAB), an atom gun is used to project heavy, fast atoms (often argon or xenon) onto the surface of a target solution (matrix). 

The impact of the fast atoms on the solution surface results in desorption of secondaries (positive ions, negative ions, and neutrals) into the low-pressure gas-phase region above the matrix surface. 

Instead of bombarding the matrix surface with fast atoms, fast ions can be used. Often these are cesium (Cs+) ions. 

As with fast atoms, bombardment of the matrix with fast ions causes very similar desorption of ions and neutrals. 

The impact of a primary beam of fast atoms or ions on a target matrix (substrate and solvent) causes desorption of molecular or quasi-molecular ions characteristic of the substrate. The process is called FAB for atom bombardment or LSIMS for ion bombardment. 

On leaving the chromatographic column, the liquid flow passes along a narrow tube, into the FAB ion source, and then into the target zone of the fast atoms. 

Instead of bombarding the matrix with fast atoms, fast ions (FIB) can be used. Often these are cesium ions (Cs+ ). As with fast atoms, fast ions cause desorption of ions and neutrals from the surface of a bombarded matrix. 

By allowing any solution, but particularly the eluant from a liquid chromatographic column, to flow continuously (dynamically) across a target area under bombardment from fast atoms or ions (FAB or FIB), any eluted components of a mixture are ionized and ejected from the surface. The resulting ions are detected and recorded by a mass spectrometer. The technique is called dynamic FAB or dynamic LSIMS. 

LC can be combined with all kinds of mass spectrometers, but for practical reasons only quadrapolar, magnetic/electric-sector, and TOP instruments are in wide use. A variety of interfaces are used, including thermospray, plasmaspray, electrospray, dynamic fast-atom bombardment (FAB), particle beam, and moving belt. 

Fast-atom bombardment (FAB) is an ionization technique that produces a protonated or deprotonated molecular ion, hence a molecular mass for the sample. It can be used for analysis of peptides up to m/z about 5000. 

Desorption ionization (DI). General term to encompass the various procedures (e.g., secondary ion mass spectrometry, fast-atom bombardment, californium fission fragment desorption, thermal desorption) in which ions are generated directly from a solid or liquid sample by energy input. Experimental conditions must be clearly stated. 

Caprioli, R.M., Continuous-Flow Fast Atom Bombardment Mass Spectrometry, Wiley, New York, 1990. 

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