Fast atom bombardment source surfaces

In standard FAB, the surface of the matrix solution is depleted of analyte and suffers from radiational damage during elongated measurements. Refreshment of the surface proceeds by diffusion (limited by the viscosity of the matrix) or evaporation. Continuous-flow fast atom bombardment (CF-FAB) continuously refreshes the surface exposed to the atom beam. [107,108] The same effect is obtained in slightly different way by the frit-fast atom bombardment (frit-FAB) technique. [109,110] In addition, both CF-FAB and frit-FAB can be used for online-coupling of liquid chromatography (LC, Chap. 12) [111] or capillary electrophoresis (CE) to a FAB ion source. [112]... 

These direct ion sources exist under two types liquid-phase ion sources and solid-state ion sources. In liquid-phase ion sources the analyte is in solution. This solution is introduced, by nebulization, as droplets into the source where ions are produced at atmospheric pressure and focused into the mass spectrometer through some vacuum pumping stages. Electrospray, atmospheric pressure chemical ionization and atmospheric pressure photoionization sources correspond to this type. In solid-state ion sources, the analyte is in an involatile deposit. It is obtained by various preparation methods which frequently involve the introduction of a matrix that can be either a solid or a viscous fluid. This deposit is then irradiated by energetic particles or photons that desorb ions near the surface of the deposit. These ions can be extracted by an electric field and focused towards the analyser. Matrix-assisted laser desorption, secondary ion mass spectrometry, plasma desorption and field desorption sources all use this strategy to produce ions. Fast atom bombardment uses an involatile liquid matrix. 

To facilitate identification of separated bands, TLC/MS may be usedJ This approach may be as simple as removal of the band from the plate, extraction of the solvent into an appropriate solvent, and injection into the ion source of the MS. However, other approaches such as fast atom bombardment (FAB) and matrix- or surface-assisted laser desorption/ionization have also been used. 

Other sources are field desorption, spark source, thermal ionization, fast atom bombardment, and secondary ion mass spectrometry (see SIMS, Section G.4, Surface Analysis). 

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