Attenuator attenuated total reflection

ATR Attenuated total reflection Reflected beam attenuated Similar to IR... 

Figure Bl.22.4. Differential IR absorption spectra from a metal-oxide silicon field-effect transistor (MOSFET) as a fiinction of gate voltage (or inversion layer density, n, which is the parameter reported in the figure). Clear peaks are seen in these spectra for the 0-1, 0-2 and 0-3 inter-electric-field subband transitions that develop for charge carriers when confined to a narrow (<100 A) region near the oxide-semiconductor interface. The inset shows a schematic representation of the attenuated total reflection (ATR) arrangement used in these experiments. These data provide an example of the use of ATR IR spectroscopy for the probing of electronic states in semiconductor surfaces [44]-...

Attenuated total reflectance (ATR) cell for use In Infrared spectroscopy. 

Attenuated total reflectance spectroscopy and reflection-absorption infrared spectroscopy... 

The attenuated total reflectance (ATR) technique is used commonly in the near-infrared for obtaining absorption spectra of thin Aims and opaque materials. The sample, of refractive index i, is placed in direct contact with a material which is transparent in the region of interest, such as thallium bromide/thallium iodide (known as KRS-5), silver chloride or germanium, of relatively high refractive index so that Then, as Figure 3.f8... 

Attenuated Total Reflectance Fourier Transform Infrared Spectroscopy. Attenuated total redectance (atr) ftir spectroscopy is based on the principle of total internal redection (40). Methods based on internal redection in the uv and visible regions of the spectmm are also common in addition to those in the ir region. The implementation of internal redection in the ir region of the spectmm provides a means of obtaining ir spectra of surfaces or interfaces, thus providing moleculady-specific vibrational information. 

Attenuated total reflection, on which atr—ftir is based, occurs when the rarer medium is absorbing and is characterized by a complex refractive index (40). The absorbing characteristics of this medium allow coupling to the evanescent field such that this field is attenuated to an extent dependent on k. The critical angle in the case of attenuated total reflection loses its meaning, but internal reflection still occurs. Thus, if the internally reflected beam is monitored, its intensity will reflect the loss associated with the internal reflection process at the interface with an absorbing medium. 

Fig. 24. Attenuated total reflectance of thin film of thickness d and refractive index on a substrate of refractive index at the surface of internal reflection element (IRE) of refractive index Decay of evanescent field beyond thickness of thin film indicated.

Attenuated total reflection (ATR), also called internal reflection, is based on the phenomenon of total internal reflection. In ATR the infrared beam is directed into an infrared-transmitting crystal so that it strikes the crystal surface at less than the critical angle and undergoes total internal reflection. 

M. W. AT2rs1, Attenuated Total Reflectance Spectroscopy of Polymers Theory and Practice, American Chemical Society, Washington, D.C., 1996. 

DETERMINATION OF NUTRITIONAL PARAMETERS OF YOGHURT SAMPLES THROUGH PARTIAL-LEAST-SQUARES ATTENUATED TOTAL REFLECTANCE FOURIER TRANSFORM INFRARED SPECTROMETRY... 

The aim of this work is the determination of several nutritional parameters, such as Energetic Value, Protein, Fat, and Carbohydrates content, in commercially available yoghurt samples by using Attenuated Total Reflectance Fourier Transform Infrared (ATR-FT-IR) spectrometry and a partial least square approach. 

Figure 3 Typical beam path configuration for collecting an FTIR spectrum using an attenuated total reflectance element Iq is the incident infrared beam, f is the exiting beam.

Surface analysis has made enormous contributions to the field of adhesion science. It enabled investigators to probe fundamental aspects of adhesion such as the composition of anodic oxides on metals, the surface composition of polymers that have been pretreated by etching, the nature of reactions occurring at the interface between a primer and a substrate or between a primer and an adhesive, and the orientation of molecules adsorbed onto substrates. Surface analysis has also enabled adhesion scientists to determine the mechanisms responsible for failure of adhesive bonds, especially after exposure to aggressive environments. The objective of this chapter is to review the principals of surface analysis techniques including attenuated total reflection (ATR) and reflection-absorption (RAIR) infrared spectroscopy. X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES), and secondary ion mass spectrometry (SIMS) and to present examples of the application of each technique to important problems in adhesion science. 

In order to characterize the surface regions of a sample that has been modified in some way, as is usually the case in adhesion-related investigations, some sort of a reflection experiment is required. Two types of experiments, attenuated total reflection (ATR) and reflection-absorption infrared spectroscopy (RAIR),... 

For on-bead analysis vibrational spectroscopy (IR-spectroscopy) can be employed attenuated total reflection is a method allowing fast and nondestructive on-bead analysis of small samples (single bead analysis) without significant sample preparation. Solid phase NMR is the method of choice if complex structural analysis is intended on the support. Spatially resolved analysis on the resin is possible with microscopic techniques. 

While electron or ion beam techniques can only be applied under ultra-high vacuum, optical techniques have no specific requirements concerning sample environment and are generally easier to use. The surface information which can be obtained is, however, quite different and mostly does not contain direct chemical information. While with infra-red attenuated total reflection spectroscopy (IR-ATR) a deep surface area with a typical depth of some micrometers is investigated, other techniques like phase-measurement interference microscopy (PMIM) have, due to interference effects, a much better surface sensitivity. PMIM is a very quick technique for surface roughness and homogeneity inspection with subnanometer resolution. 

In infra-red attenuated total reflection spectroscopy (IR-ATR) and grazing incidence reflection IR spectroscopy (IR-GIR) the evanescent wave of a totally... 

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