Morphology, analysis

Electrolyte used Method of analysis Morphological parameters studied Reference... 

Quantitative ability to carry out quantitative analysis morphological, ability to examine morphology of the surface. 

Key Words Immunohistochemistry digital image analysis morphological parameters cell area optical density cytoskeletal proteins. 

Scanning transmission X-ray microscopy has been used most extensively for polymer research, e.g. for bulk characterisation of polymeric materials with chemical sensitivity at a spatial resolution of 50 nm [739], STXM has also been used for the analysis (morphology, size distributions, spatial distributions and quantitative chemical compositions) of copolymer polyol-reinforcing particles in polyurethane [740], Pitkethly [741] has reviewed the role of microscopy in the evaluation of fibre/matrix interfacial properties and micromechanical characteristics of fibre-reinforced plastic composites. 

The above approximation, however, is valid only for dilute solutions and with assemblies of molecules of similar structure. In the event that concentration is high where intemiolecular interactions are very strong, or the system contains a less defined morphology, a different data analysis approach must be taken. One such approach was derived by Debye et al [21]. They have shown tliat for a random two-phase system with sharp boundaries, the correlation fiinction may carry an exponential fomi. 

Lamellar morphology variables in semicrystalline polymers can be estimated from the correlation and interface distribution fiinctions using a two-phase model. The analysis of a correlation function by the two-phase model has been demonstrated in detail before [30,11] The thicknesses of the two constituent phases (crystal and amorphous) can be extracted by several approaches described by Strobl and Schneider [32]. For example, one approach is based on the following relationship ... 

Imaging of Surfaces—Analysis of Surface Morphology. Several important techniques can help answer the question what does the surface look like This question is often the first one to be posed ia the characterization of a new surface or iaterface. Physical imaging of the surface is necessary to distinguish the relevant features important for understanding the whole surface and is essential for accurate iaterpretation of data from other surface analysis techniques which might later be appHed to a more limited region of the surface or iaterface. 

Additional information on elastomer and SAN microstmcture is provided by C-nmr analysis (100). Rubber particle composition may be inferred from glass-transition data provided by thermal or mechanochemical analysis. Rubber particle morphology as obtained by transmission or scanning electron microscopy (101) is indicative of the ABS manufacturing process (77). (See Figs. 1 and 2.)... 

The physical techniques used in IC analysis all employ some type of primary analytical beam to irradiate a substrate and interact with the substrate s physical or chemical properties, producing a secondary effect that is measured and interpreted. The three most commonly used analytical beams are electron, ion, and photon x-ray beams. Each combination of primary irradiation and secondary effect defines a specific analytical technique. The IC substrate properties that are most frequendy analyzed include size, elemental and compositional identification, topology, morphology, lateral and depth resolution of surface features or implantation profiles, and film thickness and conformance. A summary of commonly used analytical techniques for VLSI technology can be found in Table 3. 

There are tests for physical properties such as deasity and hardness (qv) of plastics. Microscopy (qv) is important ia fracture analysis as well as ia analysis of the morphology of polymer systems for an understanding of polymer blend performance. 

The molecular stmcture of the copolymers is also important. Molecular-weight measurements (osmometry, gpc) and functional group analysis are useful. Block copolymers require supermolecular (morphological) stmctural information as well. A listing of typical copolymer characterization tools and methods is shown in Table 6. 

Information on the morphology of the nanohybrid sorbents also was revealed with SEM analysis. Dispersed spherical polymer-silica particles with a diameter of 0.3-5 pm were observed. Every particle, in one s turn, is a porous material with size of pores to 200 nm and spherical particles from 100 nm to 500 nm. Therefore, the obtained samples were demonstrated to form a nanometer - scale porous structure. 

Element stmctures of chitincontaining sorbents are determined using standard methods. Behind the data of an element stmcture the contents of chitin in ChCS was calculated. The analysis of morphological frame of ChCS was conducted by a electron-microscopic method on a raster supermicroscope at increase from 500 up to 1000 times. For matching is samples ChCS were conducted IR reseai ch in the field of 400 - 4000 cm f... 

Electron Probe Microanalysis, EPMA, as performed in an electron microprobe combines EDS and WDX to give quantitative compositional analysis in the reflection mode from solid surfaces together with the morphological imaging of SEM. The spatial resolution is restricted by the interaction volume below the surface, varying from about 0.2 pm to 5 pm. Flat samples are needed for the best quantitative accuracy. Compositional mapping over a 100 x 100 micron area can be done in 15 minutes for major components Z> 11), several hours for minor components, and about 10 hours for trace elements. 

Another example of static SIMS used in a more quantitative role is in the analysis of extmded polymer blends. The morphology of blended polymers processed by extrusion or molding can be affected by the melt temperature, and pressure, etc. The surface morphology can have an effect on the properties of the molded polymer. Adhesion, mechanical properties, and physical appearance are just a few properties affected by processing conditions. 

In a molded polymer blend, the surface morphology results from variations in composition between the surface and the bulk. Static SIMS was used to semiquan-titatively provide information on the surface chemistry on a polycarbonate (PC)/polybutylene terephthalate (PBT) blend. Samples of pure PC, pure PBT, and PC/PBT blends of known composition were prepared and analyzed using static SIMS. Fn ment peaks characteristic of the PC and PBT materials were identified. By measuring the SIMS intensities of these characteristic peaks from the PC/PBT blends, a typical working curve between secondary ion intensity and polymer blend composition was determined. A static SIMS analysis of the extruded surface of a blended polymer was performed. The peak intensities could then be compared with the known samples in the working curve to provide information about the relative amounts of PC and PBT on the actual surface. 

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