Peak characteristics

In a molded polymer blend, the surface morphology results from variations in composition between the surface and the bulk. Static SIMS was used to semiquan-titatively provide information on the surface chemistry on a polycarbonate (PC)/polybutylene terephthalate (PBT) blend. Samples of pure PC, pure PBT, and PC/PBT blends of known composition were prepared and analyzed using static SIMS. Fn ment peaks characteristic of the PC and PBT materials were identified. By measuring the SIMS intensities of these characteristic peaks from the PC/PBT blends, a typical working curve between secondary ion intensity and polymer blend composition was determined. A static SIMS analysis of the extruded surface of a blended polymer was performed. The peak intensities could then be compared with the known samples in the working curve to provide information about the relative amounts of PC and PBT on the actual surface. 

An XPS spectrum consists of a plot of N(E)/E, the number of photoelectrons in a fixed small interval of binding energies, versus E. Peaks appear in the spectra at the binding energies of photoelectrons that are ejected from atoms in the solid. Since each photoemission process has a different probability, the peaks characteristic of a particular element can have significantly different intensities. 

When an element is present on the surface of a sample in several different oxidation states, the peak characteristic of that element will usually consist of a number of components spaced close together. In such cases, it is desirable to separate the peak into its components so that the various oxidation states can be identified. Curve-fitting techniques can be used to synthesize a spectrum and to determine the number of components under a peak, their positions, and their relative intensities. Each component can be characterized by a number of parameters, including position, shape (Gaussian, Lorentzian, or a combination), height, and width. The various components can be summed up and the synthesized spectrum compared to the experimental spectrum to determine the quality of the fit. Obviously, the synthesized spectrum should closely reproduce the experimental spectrum. Mathematically, the quality of the fit will improve as the number of components in a peak is increased. Therefore, it is important to include in a curve fit only those components whose existence can be supported by additional information. 

The XRD peaks characteristic of Co and Ni disappeared after the treatment, as did the broad ESR line, successfully leaving only the narrow asymmetric line with 26 G linewidth as shown in Fig. 8 [40]. The g-value of the narrow line is =2.002 0.001. The narrow ESR line shows Dysonian at all temperatures in the range of 4-300 K. Furthermore, the ESR intensity is quite independent of T and thus the density of conduction electrons is invariant as a function of temperature as shown in Fig. 9. These show that the material is highly metallic, even at low 7. 

From the complexity of the subject and from many studies carried out in this connection, it is almost impossible to draw clear conclusions so we must confine ourselves to some general and fairly superficial statements about the peak characteristics (see Fig. 3.64). 

The infrared (IR) spectra of these compounds were mostly studied in the solid state which showed all the basic peaks characteristic of various functionalities attached to such bicyclic heterocycles with bridgehead nitrogen atoms. The difference in the frequency of carbonyl and carbon nitrogen double bond in tautomers of compound 18 (R = H) has been discussed previously in CHEC-II(1996) <1996CHEC-II(8)713>. 

Due to the possible change in retention time and peak profile that may take place during day-to-day operation, it is necessary to measure peak characteristics every day to verify the status of the method validation. A blank sample should be evaluated for an analysis run, where the resolution is determined. For asymmetric peaks, the Gaussian equation cannot be used, so the modified equation, using an exponentially modified Gaussian (EMG) method has been proposed [21]. 

SIMS spectra of the RhCf salt in Fig. 9.1 show clear molecular peaks characteristic of rhodium coordinated by chlorine. In particular the RhCl2 signal is very intense. As explained in Chapter 4, there is little doubt that molecular cluster ions from compounds other than alloys are the result of a direct emission process. Hence, Fig. 9.1 implies that if a sample contains rhodium atoms with more than one chlorine ligand, SIMS is capable of detecting this combination with high sensitivity. 

Thomas et al. (39,41) recorded the Si-NMR spectrum of an aluminum-deficient Y zeolite prepared by reacting NaY zeolite with SiCl vapors. The spectrum showed a single sharp peak, characteristic of Si(0 Al) groupings, and indicative of an essentially luminum-free faujasite structure. 

The forward traces may therefore be computed in dimensionless form for any values of the two parameters p and 0C. Of particular usefulness is the estimation of the effect of ohmic drop and double-layer charging on the peak characteristics. The exact values of the peak, peak potential, and peak width may be found in Table 1 of reference 19. As an example, the shifts undergone by the dimensionless peak potential are shown in Figure 1.9. 

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