Point Analysis Providing Morphology, Texture and Strata Distribution

5 Point Analysis Providing Morphology, Texture and Strata Distribution 

Many of the instrumental methods yielding morphological, topological, and textural information of objects are based on microscopy techniques. Although light 

Electron microscopy is an efficient microscopy technique that has been extensively used for the material characterization of artistic and archaeological objects, especially in combination with x-ray microanalysis [54], The use of electrons instead of light in these instruments is the basis of the higher resolution ( 9-0.2 nm) and has greater depth of held than LM. Thus, characterization of the finest topography of the surface objects is possible, and additional analytical information can be obtained. Different electron microscopes are currently used in art and art conservation studies scanning electron microscopes (SEM), Cryo-SEM 

The AFM maps the topography of a substrate by monitoring the interaction force between the sample and a sharp tip attached to the end of a cantilever so that the morphology of the surface of the studied sample can be reproduced at nanometer resolution (Fig. 1.8). Some works can be found in literature, reporting studies in which AFM has been applied to the examination of art and archaeological objects [55]. 

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