Scanning transmission

Crewe A V, Wall J and Welter L M 1968 A high resolution scanning transmission electron microscope J. Appl. Phys. 39 5861-8... 

Figure Bl.24.17. An example of scanning transmission ion microscopy (STIM) measurements of a human oral cancer cell. The different images indicate different windows in the energy of transmitted helium ions as indicated in the figure. White indicate areas of high counts. The teclmique offers a thickness scan through the sample, and, in this case, the cell walls of one specific cell can be seen in the areas dominated by thicker structures (data from C A Pineda, National Accelerator Centre, Fame, South Africa).

The very high powers of magnification afforded by the electron microscope, either scanning electron microscopy (sem) or scanning transmission electron microscopy (stem), are used for identification of items such as wood species, in technological studies of ancient metals or ceramics, and especially in the study of deterioration processes taking place in various types of art objects. 

Figure 1 Signals generated when the focussed electron beam interacts with a thin specimen in a scanning transmission electron microscope (STEM).

Transmission electron microscopes (TEM) with their variants (scanning transmission microscopes, analytical microscopes, high-resolution microscopes, high-voltage microscopes) are now crucial tools in the study of materials crystal defects of all kinds, radiation damage, ofif-stoichiometric compounds, features of atomic order, polyphase microstructures, stages in phase transformations, orientation relationships between phases, recrystallisation, local textures, compositions of phases... there is no end to the features that are today studied by TEM. Newbury and Williams (2000) have surveyed the place of the electron microscope as the materials characterisation tool of the millennium . 

By use of a scanning transmission electron microscope, with the incident beam grazing the crystal surface, the structural features on surfaces have also been revealed with a resolution of I08 or better... 

Analysis of individual catalyst particles less than IMm in size requires an analytical tool that focuses electrons to a small probe on the specimen. Analytical electron microscopy is usually performed with either a dedicated scanning transmission electron microscope (STEM) or a conventional transmission electron microscope (TEM) with a STEM attachment. These instruments produce 1 to 50nm diameter electron probes that can be scanned across a thin specimen to form an image or stopped on an image feature to perform an analysis. In most cases, an electron beam current of about 1 nanoampere is required to produce an analytical signal in a reasonable time. 

The scanning transmission electron microscope (STEM) was used to directly observe nm size crystallites of supported platinum, palladium and first row transition metals. The objective of these studies was to determine the uniformity of size and mass of these crystallites and when feasible structural features. STEM analysis and temperature programmed desorption (TPD) of hydrogen Indicate that the 2 nm platinum crystallites supported on alumina are uniform In size and mass while platinum crystallites 3 to 4 nm in size vary by a factor of three-fold In mass. Analysis by STEM of platinum-palladium dn alumina established the segregation of platinum and palladium for the majority of crystallites analyzed even after exposure to elevated temperatures. Direct observation of nickel, cobalt, or iron crystallites on alumina was very difficult, however, the use of direct elemental analysis of 4-6 nm areas and real time Imaging capabilities of up to 20 Mx enabled direct analyses of these transition metals to be made. Additional analyses by TPD of hydrogen and photoacoustic spectroscopy (PAS) were made to support the STEM observations. 

Figure 5 shows the Z-contrast scanning transmission electron microscope (STEM) image of a Ru/Sn02 nanocomposite catalyst prepared by the assembly process [18]. A combined EDX analysis, using an electron beam of... 

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