Spectroscopy Secondary Ion

The oxidation and degradation of small hydrocarbon molecules have many similarities (Fig. 8.10). These reactions have been studied extensively by a variety of surface techniques such as Thermal Desorption (TDS), ion mass spectroscopy, specular infrared spectroscopy, Secondary Ion Mass Spectroscopy (SIMS), X-ray Photoelectron Spectroscopy (XPS), and so on. The reaction pathways and the final products depend on the type of oxygen-bearing species, which in turn depends on the doping and morphology of the oxide layer. This is the major reason why results obtained with different oxide sensors in different laboratories do not always agree. [Pg.254]

Four UHV spectroscopies used for the compositional and chemical analysis of surfaces are discussed. These are X-ray Photoemission, Auger Spectroscopy, Secondary Ion Mass Spectroscopy, and Ion Scattering (both low and high energy). Descriptions of the basic processes and information contents are given, followed by a comparative discussion of the surface sensitivities, advantages and disadvantages of each spectroscopy. [Pg.13]

Ions Ion Scattering Mass Spectroscopy, Laser Microprobe Mass Analyzer, Rutherford Backscattering Spectroscopy, Secondary Ion Mass Spectroscopy. [Pg.143]

ESCA UPS SIMS STM IR UV electron spectroscopy for chemical analysis ultra-violet photoelectron spectroscopy secondary ion mass spectroscopy scanning tunneling microscopy infra-red ultra-violet... [Pg.136]

Auger electron spectroscopy X-ray electron spectroscopy Secondary ion mass spectrometry... [Pg.165]

For the analysis of the new surface after every removal one may use all the surface techniques already mentioned in Sect. 4.3.1 as long as their information depth does not exceed the thickness of the layer removed Auger and ESCA-spectroscopy, secondary-ion mass spectrometry (SIMS), backscattering, ion-induced X-ray and nuclear reaction analysis. In addition, one may investigate the content of the element of interest in the removed layer. Because of the low absolute concentration of implanted ions most of the standard methods of analysis fail. The best results come from implantations of radioactive elements followed by measuring the radioactivity of the dissolved removed layer. [Pg.42]

Specific spectroscopic techniques are used for the analysis of polymer surface (or more correctly of a thin layer at the surface of the polymer). They are applied for the study of surface coatings, surface oxidation, surface morphology, etc. These techniques are typically done by irradiating the polymer surface with photons, electrons or ions that penetrate only a thin layer of the polymer surface. This irradiation is followed by the absorption of a part of the incident radiation or by the emission of specific radiation, which is subsequently analyzed providing information about the polymer surface. One of the most common techniques used for the study of polymer surfaces is attenuated total reflectance in IR (ATR), also known as internal reflection spectroscopy. Other techniques include scanning electron microscopy, photoacoustic spectroscopy, electron spectroscopy for chemical analysis (ESCA), Auger electron spectroscopy, secondary ion mass spectroscopy (SIMS), etc. [Pg.27]

The analytical determination of the foreign element c ncentration and distribution in tungsten is linked with highly sophisticated equipment (Auger spectroscopy, secondary ion mass spectrometry) and with complicated pretreatment of the samples. This may be one reason why our knowledge about foreign element influences is still quite incomplete. [Pg.17]

Recently, new instrumental techniques have become available for determining surface structures on an atomic scale. These include X-ray fine structure (EXAFS), electron spectroscopies, ultraviolet photoelectron spectroscopy (UPS), X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES), ion spectroscopies, secondary-ion... [Pg.90]

A whole host of characterization techniques have been employed to assess the occurrence and the extent of the modification. These tools include FTIR and XPS spectroscopy, elemental analysis, contact angle measurements, inverse gas chromatography (IGC) and scanning electron microscopy (SEM). New emerging techniques, such as the take-off angle photoelectron spectroscopy, secondary ion mass spectrometry (SIMS), solid state NMR, confo-cal fluorescence microscopy and atomic force microscopy (AFM) have recently started to he used in this field. [Pg.386]

See also Mass Spectrometry Liquid Secondary Ion Mass Spectrometry. Polymers Natural Rubber Synthetic. Surface Analysis Auger Eiectron Spectroscopy Secondary Ion Mass Spectrometry of Polymers. [Pg.4605]

ABSTRACT. The paper details the use of scanning electron microscopy, surface reflectance infrared spectroscopy, Auger electron spectroscopy, ion scattering spectroscopy, secondary ion mass spectroscopy, and x-ray photoelectron spectroscopy in the analysis of polymeric adhesives and composites. A brief review of the principle of each surface analytical technique will be followed by application of the technique to interfacial adhesion with an emphasis on polymer/metal, fiber/matrix, and composite/composite adhesion. [Pg.125]

Meijers ACQM, de Jong AM, Van Gruijthuijsen LMP, Niemantsverdriet JW. Preparation of zirconium oxide on silica and characterization by X-ray photoelectron spectroscopy, secondary ion mass spectrometry, temperature programmed oxidation and infra-red spectroscopy. Appl Catal. 1991 70 53-71. [Pg.264]

Keywords Polysiloxanes, thermogravimetry, FTIR, Raman, X-ray photoelectron spectroscopy, secondary ion mass spectroscopy,... [Pg.177]

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