Secondary ion mass spectroscopy surfaces

Static Si iViS Static Secondary Ion Mass Spectroscopy Surface Ion beam (0.5-20 keV) Secondary ions, analysis with mass spectrometer 0.1-0.6 nm 10 pm Elemental analysis ol surface layers molecular analysis deleclion limils ppb-ppm 4... 

Surface secondary ion mass spectroscopy (surface SIMS) <300 A... 

SIMS Secondary-ion mass spectroscopy [106, 166-168] (L-SIMS liquids) [169, 170] Ionized surface atoms are ejected by impact of -1 keV ions and analyzed by mass spectroscopy Surface composition... 

SIMS Secondary Ion mass spectroscopy A beam of low-energy Ions Impinges on a surface, penetrates the sample and loses energy In a series of Inelastic collisions with the target atoms leading to emission of secondary Ions. Surface composition, reaction mechanism, depth profiles... 

The main experimental techniques used to study the failure processes at the scale of a chain have involved the use of deuterated polymers, particularly copolymers, at the interface and the measurement of the amounts of the deuterated copolymers at each of the fracture surfaces. The presence and quantity of the deuterated copolymer has typically been measured using forward recoil ion scattering (FRES) or secondary ion mass spectroscopy (SIMS). The technique was originally used in a study of the effects of placing polystyrene-polymethyl methacrylate (PS-PMMA) block copolymers of total molecular weight of 200,000 Da at an interface between polyphenylene ether (PPE or PPO) and PMMA copolymers [1]. The PS block is miscible in the PPE. The use of copolymers where just the PS block was deuterated and copolymers where just the PMMA block was deuterated showed that, when the interface was fractured, the copolymer molecules all broke close to their junction points The basic idea of this technique is shown in Fig, I. 

The interface properties can usually be independently measured by a number of spectroscopic and surface analysis techniques such as secondary ion mass spectroscopy (SIMS), X-ray photoelectron spectroscopy (XPS), specular neutron reflection (SNR), forward recoil spectroscopy (FRES), scanning electron microscopy (SEM) and transmission electron microscopy (TEM), infrared (IR) and several other methods. Theoretical and computer simulation methods can also be used to evaluate H t). Thus, we assume for each interface that we have the ability to measure H t) at different times and that the function is well defined in terms of microscopic properties. 

The most widely used techniques for surface analysis are Auger electron spectroscopy (AES), x-ray photoelectron spectroscopy (XPS), secondary ion mass spectroscopy (SIMS), Raman and infrared spectroscopy, and contact angle measurement. Some of these techniques have the ability to determine the composition of the outermost atomic layers, although each technique possesses its own special advantages and disadvantages. 

X-ray scattering studies at a renewed pc-Ag/electrolyte interface366,823 provide evidence for assuming that fast relaxation and diffu-sional processes are probable at a renewed Sn + Pb alloy surface. Investigations by secondary-ion mass spectroscopy (SIMS) of the Pb concentration profile in a thin Sn + Pb alloy surface layer show that the concentration penetration depth in the solid phase is on the order of 0.2 pm, which leads to an estimate of a surface diffusion coefficient for Pb atoms in the Sn + Pb alloy surface layer on the order of 10"13 to lCT12 cm2 s i 820 ( p,emicai analysis by electron spectroscopy for chemical analysis (ESCA) and Auger ofjust-renewed Sn + Pb alloy surfaces in a vacuum confirms that enrichment with Pb of the surface layer is probable.810... 

The control of materials purity and of environmental conditions requires to implement physico-chemical analysis tools like ESC A, RBS, AUGER, SEM, XTM, SIMS or others. The principle of SIMS (Secondary Ion Mass Spectroscopy) is shown in Eig. 31 an ion gun projects common ions (like 0+, Ar+, Cs+, Ga+,. ..) onto the sample to analyze. In the same time a flood gun projects an electron beam on the sample to neutralize the clusters. The sample surface ejects electrons, which are detected with a scintillator, and secondary ions which are detected by mass spectrometry with a magnetic quadrupole. 

Benninghoven, A., Surface Investigation of Solids by the Static Mmethod of Secondary Ion Mass Spectroscopy (SIMS), Surf Set., Vol. 35,1973, pp. 427-457. 

We will first consider, however, Secondary Ion Mass Spectroscopy (SIMS) in which both neutral and charged species are sputtered from the surface, and detected by means of a mass spectrometer. This involves ion beams of lower energy than in the techniques described previously. 

Cherepin, V. (1987) Secondary Ion Mass Spectroscopy of Solid Surfaces, VNU Science Press, Utrecht. 

Wang, D., Jones F.R. and Denison, P. (1992a). Surface analytical study of the interaction between r-aminopropyltriethoxysilane (APS) and E-glass surface. Part 1-Time of flight secondary ion mass spectroscopy. J. Mater. Sci. 27, 36-48. 

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