Spectroscopy Rutherford Backscattering

Principles and Characteristics The basic and most mature method of materials analysis by energetic ion beams is elastic Rutherford backscattering spectroscopy (RBS). As it is practised today to interrogate a sample RBS uses typically a well collimated mono-energetic beam of O -particles from a Van der Graaf accelerator or from a variety of small accelerators, with energy 0 1-5 MeV [233]. The He + particles backscattered 

Surface Analytical Techniques for Polymer/Additive Formulations 

Principles Mass sensitivity to energetic ion beams Characteristic X-rays from ion-atom collisions 

Current density for high sensitivity 10l3 10l3 

Other techniques (AES, XPS, PIXE, GD-OES, SIMS, recoil spectrometry) yield similar information as RBS. Table 4.14 summarises some essential features of the high-energy microbeam analysis methods RBS and PIXE. RBS has the ability to analyse for the lightest elements, which PIXE cannot deal with. 

The RBS technique is widely used for near-surface layer analysis of solids and is useful to determine the profile of concentration vs. depth for heavy elements in a light material as a function of the detected energy. RBS using deuteron beam has been found to be a useful compromise between proton and a-particle RBS for the thicker layers often encountered in art and archaeology (Barfoot 1986). 

While using PIXE, the multielement analysis is possible over a wide range of elements in a depth region, the RBS technique has an edge over PIXE technique in those cases where the depth distribution of one or more elements 

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Nitrogen content Raman spectroscopy Rutherford backscattering spectroscopy (RBS)... 

The use of nuclear techniques allows the determination of C, N, H, O, and heavier contaminants relative fractions with great accuracy, and of the elements depth profile with moderate resolution (typically 10 nm). Rutherford backscattering spectroscopy (RBS) of light ions (like alpha particles) is used for the determination of carbon and heavier elements. Hydrogen contents are measured by forward scattering of protons by incident alpha particles (ERDA) elastic recoil detection analysis [44,47]. 

Ion beam probes are used in a wide range of techniques, including Secondary Ion Mass Spectroscopy (SIMS), Rutherford backscattering spectroscopy (RBS) and proton-induced X-ray emission (PIXE). The applications of these and number of other uses of ion beam probes are discussed. 

Figure 7. Carbon and oxygen content of 0.12 nm palladium acetate film, measured by Rutherford backscattering spectroscopy, as a function of 2 MeV He+ ion dose.

It is suggested that P occupies an empty tetrahedral position. Yubero et al. (2000) claim, on the basis of Rutherford backscattering spectroscopy, that up to 0.04 mol mol of Ar could be incorporated in the structure of hematite prepared from Fe(CO)s by ion beam assisted deposition in the presence of 0 and Ar", followed by annealing at 500 °C. 

Rutherford backscattering spectroscopy Composition to a depth of some nm He in, He out... 

Cherniak D.J. and Ryerson F.J. (1993) A study of strontium diffusion in apatite using Rutherford backscattering spectroscopy and ion implantation. Geochim. Cosmochim. Acta 57, 4653-4662. 

Hammouda T. and Cherniak D.J. (2000) Diffusion of Sr in fluorphlogopite determined by Rutherford backscattering spectroscopy. Earth Planet. Sci. Lett. 178, 339-349. 

Zhang, Y., et al., Damage Evolution and Recovery on Both Si and C Sublattices in Al-Implanted 4H-SiC Studied by Rutherford Backscattering Spectroscopy and Nuclear Reaction Analysis, J. Appl. Phys., Vol. 91, No. 10, 2002, pp. 6388-6395. 

Rutherford Backscattering Spectroscopy (RBS) can also give compositional information. It is a highly surface sensitive technique requiring specialized equipment and is best for samples containing elements with Z s that differ by several atomic numbers. The accuracy of RBS is controlled by counting statistics but is usually about 5%. 

RBS REE Rutherford backscattering spectroscopy Rare earth elements (lanthanides + Y)... 

Using various amines added to the ammonia bath (in most cases with added hydrazine), sphalerite ZnS fihns were obtained with a crystal size of ca. 3 nm [ 118]. Rutherford Backscattering Spectroscopy (RBS) analyses showed that there was about twice as much Zn in the fihns as S. (More basic solution and more hydrazine gave more stoichiometric films). Extended X-ray Absorption Fine Structure (EX-AFS) and Fourier Transform Infra-red (EUR) spectroscopy showed that the fihns did not have Zn-0 groups but rather Zn-OH ones [122] and that there is probably a mixture of ZnS and unreacted Zn(OH)2, quite likely as a ZnS shell around a Zn(OH)2 core. Optical spectra gave a bandgap of ca. 3.85 eV, considerably blue-shifted from the bulk value of 3.6 eV, as expected from such small crystals. 

Rutherford Backscattering Spectroscopy Reflection High-Energy Electron Diffraction Scanning Electron Microscopy Surface (Sensitive) Extended X-Ray Absorption Fine Structure... 

Rutherford backscattering spectroscopy reflected high energy electron diffraction scanning Auger microscopy... 

Ions Ion Scattering Mass Spectroscopy, Laser Microprobe Mass Analyzer, Rutherford Backscattering Spectroscopy, Secondary Ion Mass Spectroscopy. 

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