Spectroscopy SSIMS static secondary ion mass

Static secondary ion mass spectroscopy (SSIMS) is another surface selective technique for surface characterisation [262, 263, 264]. The information obtained from SSIMS is complementary to XPS because SSIMS can differentiate those polymers that give very similar XPS spectra. Moreover, it offers more surface selectivity than XPS. The typical sampling depth of SSIMS is approximately 1 nm. This method has sensitivity, sufficient to detect amounts less than a monomolecular layer, particularly when a high resolution time-of-flight (ToF) mass analyser is used [265]. 

Static secondary ion mass spectroscopy (SSIMS) ranks with XPS as one of the principal surface analytical techniques. Treatment of polymer surfaces to improve their properties with respect to wetting or water repulsion and to adhesion, is by now a standard procedure. The treatment is designed to change the chemistry of the outermost groups in the polymer without affecting bulk properties. One popular surface treatment is plasma etching. The use of SSIMS is most amenable to the surface evaluation of such treated materials. 

Time of flight static secondary ion mass spectroscopy (SSIMS) has been applied to perfluorinated polymers, polystyrene, polyacylacrylates (including poly cyclo-hexylmethacrylate, polybenzyl methacrylate, polyphenyl methacrylate, poly n-hexyl methacrylate, poly n-butyl methacrylate, polymethylmethacrylate, poly n-propyl methacrylate, polyisopropyl methacrylate and poly secbutyl methacrylate). Blends of polystyrene and polyvinyl chloride, bisphenol A and polystyrene, polycarbonate and polystyrene and tetramethyl bisphenol A and polycarbonate have also been studied by this technique. 

We have undertaken a series of experiments Involving thin film models of such powdered transition metal catalysts (13,14). In this paper we present a brief review of the results we have obtained to date Involving platinum and rhodium deposited on thin films of tltanla, the latter prepared by oxidation of a tltanliua single crystal. These systems are prepared and characterized under well-controlled conditions. We have used thermal desorption spectroscopy (TDS), Auger electron spectroscopy (AES) and static secondary Ion mass spectrometry (SSIMS). Our results Illustrate the power of SSIMS In understanding the processes that take place during thermal treatment of these thin films. Thermal desorption spectroscopy Is used to characterize the adsorption and desorption of small molecules, In particular, carbon monoxide. AES confirms the SSIMS results and was used to verify the surface cleanliness of the films as they were prepared. 

X-Ray Photoelectron Spectroscopy (XPS) and Static Secondary Ion Mass Spectrometry (SSIMS) of Biomedical Polymers and Surfactants... 

Successfully developing a surface engineering strategy based on surfactant behavior at interfaces requires surface characterization techniques that can validate and quantify surface chemistry changes. This review describes the role of two surface chemistry analysis techniques that have proven highly successful in surfactant analysis x-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectrometry (SSIMS). In Section II, the methods by which these techniques analyze surface chemistry are described. In Section III, recent examples of their application in surfactant-based surface engineering are described. 

A confirmation of the above hypothesis has been provided by static secondary ion mass spectrometry (SSIMS) and x-ray photoelectron spectroscopy (XPS) [64-67]. Ward et al. [67] used atomic ratios from XPS to estimate the thickness of the surface lipid layer as 0.9 nm, which is less than half of that estimated by Negri et al. [42] from the length of a 20-carbon... 

Among these, some of the most frequently used are attenuated total reflectance Fourier transform infrared (ATR-FTIR) spectroscopy. X-ray photoelectron spectroscopy (XPS), static secondary ion mass spectrometry (SSIMS), energy dispersive X-ray spectroscopy (EDS), optical microscopy, laser confocal scanning microscopy (LCSM), scanning electron microscopy (SEM), enviromnental scanning electron microscopy (ESEM), transmission electron microscopy (TEM), atomic force microscopy (AFM), contact angle measurement, and some evaluation methods for the biocompatibility of membrane surfaces. 

Techniques that have been applied include time of flight static secondary ion mass spectrometry (SSIMS)/ " low energy ion scattering spectromehy, x-ray photoelectron microscopy scanning electrochemical microscopy (SECM), laser ionization mass spectrometry, surface enhanced infrared reflection spectroscopy, Fourier Transform infrared spechoscopy and nuclear magnetic resonance spectroscopy. ... 

There are other spectroscopy methods also available for characterizing silane-coated surfaces such as SSIMS (static secondary ion mass spectrometry), AFM... 

INS Ion neutralization spectroscopy MQS Metastable quenching spectroscopy SSIMS Static secondary-ion mass spectrometry ISS Ion scattering spectroscopy... 

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