Surfaces Auger analysis

The electrodeposited precursor films prepared in our laboratory that produced high-efficiency devices were Cu-rich films. These precursor films required additional In, Ga, and Se, deposited by PVD, to adjust their final composition to Culni xGaxSe2. During this second step, the substrate temperature was maintained at 560 °C 10 °C. Figure 7.7 presents the Auger analysis of the final absorber and shows nonuniform distribution of Ga in the absorber and more Ga near the surface. This result is primarily from the second-stage PVD addition. The Ga hump is not helpful for hole collection. The device efficiencies are expected to increase by optimizing the Ga distribution in the absorber layers. The optimized layers should have less Ga in the front and more Ga on the back, which facilitates hole collection. 

The Auger and XPS analysis and interpretation of the posttreatment on iron phosphate surfaces was conducted by Dr. J. A. Kramer of Parker Chemical Company. Auger analysis was performed... 

Two-phase particles ranging from 10 to 20 microns in size, supported on a graphite substrate, were observed in-situ in the UHV chamber of a scanning Auger microprobe. Both surface composition analysis and imaging of the particles could be undertaken. The preparation of the samples has been described in detail elsewhere. ... 

Myhra, S., Delogu, P., Giorgi, R. Riviere, J. C. 1988c. Scanning and high-resolution Auger analysis of zirconolite/perovskite surfaces following hydrothermal treatment. Journal of Materials Science, 23, 1514-1520. 

In order to precise the effect of sulfur, an Auger analysis of the surface has been performed by transferring the sample in an ultra high vacuum chamber right before the... 

The Auger analysis performed right before the catalytic test confirms that the reaction is not poisoned by either an oxygen or a carbon monolayer on the surface. 

As with all surface analytical methods, surface preparation is critical to obtaining reproducible SHG from metallic surfaces and single crystals in particular. For surfaces prepared in UHV and then transferred to an electrochemical cell, sputtering and heating or annealing followed by Auger analysis of impurities should proceed inert transfer. Low energy electron diffraction (LEED) can also be used to check surface order. Metal electrode surfaces, particularly for the rotational anisotropy ex-... 

Catalyst surfaces were characterized in an Auger electron spectrometer (PHI model 548) with X-ray excitation from MgKa and electron gun. For Auger analysis the catalyst samples were pressed into a pallet of 1 mm in thickness and 12 mm in diameter. 

Secondary ion mass spectrometry (SIMS) is a relatively new technique for surface chemical analysis compared with Auger electron spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS). SIMS examines the mass of ions, instead of energy of electrons, escaped from a solid surface to obtain information on surface chemistry. The term secondary ion is used to distinguish primary ion that is the energy source for knocking out ions from a solid surface. The advantages of SIMS over electron spectroscopy are ... 

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