New emerging techniques

New emerging techniques and materials are also being examined use of nanomaterials, sol-gel techniques, layer-by-layer application, plasma deposition, and the like. An overview has been given by Horrocks (2011) and Along et al. (2014). 

A whole host of characterization techniques have been employed to assess the occurrence and the extent of the modification. These tools include FTIR and XPS spectroscopy, elemental analysis, contact angle measurements, inverse gas chromatography (IGC) and scanning electron microscopy (SEM). New emerging techniques, such as the take-off angle photoelectron spectroscopy, secondary ion mass spectrometry (SIMS), solid state NMR, confo-cal fluorescence microscopy and atomic force microscopy (AFM) have recently started to he used in this field. 

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