Secondary ion mass spectroscopy static

Static secondary ion mass spectroscopy (SSIMS) is another surface selective technique for surface characterisation [262, 263, 264]. The information obtained from SSIMS is complementary to XPS because SSIMS can differentiate those polymers that give very similar XPS spectra. Moreover, it offers more surface selectivity than XPS. The typical sampling depth of SSIMS is approximately 1 nm. This method has sensitivity, sufficient to detect amounts less than a monomolecular layer, particularly when a high resolution time-of-flight (ToF) mass analyser is used [265]. 

Briggs D, Brown A, Vickerman JC (1989) Handbook of static secondary ion mass spectroscopy, Wiley, New York... 

Static secondary ion mass spectroscopy (SSIMS) ranks with XPS as one of the principal surface analytical techniques. Treatment of polymer surfaces to improve their properties with respect to wetting or water repulsion and to adhesion, is by now a standard procedure. The treatment is designed to change the chemistry of the outermost groups in the polymer without affecting bulk properties. One popular surface treatment is plasma etching. The use of SSIMS is most amenable to the surface evaluation of such treated materials. 

Static Si iViS Static Secondary Ion Mass Spectroscopy Surface Ion beam (0.5-20 keV) Secondary ions, analysis with mass spectrometer 0.1-0.6 nm 10 pm Elemental analysis ol surface layers molecular analysis deleclion limils ppb-ppm 4... 

Ye, G., Horvai, G, Toth, A., Bertoti, I., Botreau, M., Due, T.M. (1998) Studies of ion-selective solvent polymeric membranes by X-ray photoelectron spectroscopy and time-of-fiight static secondary ion mass spectroscopy. Anal. Chem., 70,4241-4246. 

Finally, the components of PPA-1 and PPA-2 are optimized to prevent their migration from within solidified polyethylene. It is only in the melt phase under shear that the PPAs are allowed to function. To confirm this, the same films that were extruded for mechanical property measurements were evaluated over a year-long period for any surface changes. Surface energy and contact angle measurements, along with ESCA (Electron Spectroscopy for Chemical Analysis) and SSEMS (Static Secondary Ion Mass Spectroscopy) verified that there was no physical or chemical presence of intentionally elevated PPA levels. 

Time of flight static secondary ion mass spectroscopy (SSIMS) has been applied to perfluorinated polymers, polystyrene, polyacylacrylates (including poly cyclo-hexylmethacrylate, polybenzyl methacrylate, polyphenyl methacrylate, poly n-hexyl methacrylate, poly n-butyl methacrylate, polymethylmethacrylate, poly n-propyl methacrylate, polyisopropyl methacrylate and poly secbutyl methacrylate). Blends of polystyrene and polyvinyl chloride, bisphenol A and polystyrene, polycarbonate and polystyrene and tetramethyl bisphenol A and polycarbonate have also been studied by this technique. 

High-resolution electron-energy loss spectroscopy Static secondary-ion mass spectroscopy Dynamic secondary-ion mass spectroscopy Forward recoil spectroscopy... 

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