Secondary ion mass spectroscopy dynamic

The way in which fluoride is taken up by glass-ionomers has been studied using surface analysis techniques. Dynamic secondary ion mass spectroscopy (SIMS) shows that most of the fluoride becomes concentrated in the surface [248]. Its concentration with depth varies as an error function relationship [248]. X-ray photoelectron spectroscopy (XPS) has suggested that fluoride taken up becomes associated with calcium [249]. However, the form of this association is unclear, because calcium fluoride as such is very insoluble, and when added to a fluoride-free glass-ionomer cement, caused no fluoride to be released [234]. It therefore seems unlikely that the calcium-fluoride association results in formation of Cap2, and further research is necessary to determine the precise nature of the calcium-fluoride association, and thus to resolve this paradox. 

Figure 8 shows the time evolution of interfacial thickness for the PS/dPS bilayer as a function of temperature [40]. The of both PS and dPS was fixed at 29k. The interfacial characterization was made by dynamic secondary ion mass spectroscopy (DSIMS). In the case of aimealing at 400, 393, and 380 K (i.e., above the 7 of 376 K), the interfacial thickness proportionally increased to a half power of the annealing time. This is in good accordance with the context of Fickian diffusion. By contrast, a unique interfacial evolution was observed at 370 K (i.e., between 7 and T ). At first, the bilayer interface monotonically thickened with increasing time,... 

They demonstrated the surface eiuichment of the star in isotopic blend with a linear polystyrene counterpart by dynamic secondary ion mass spectroscopy. However, in this study the star polymer was the deuterated component and had a lower molar mass than the linear matrix. Therefore, one could question if these two factors aren t themselves driving the surface segregation. 

The reptation dynamics and the interface structure relations in Table 2 have been demonstrated experimentally by a series of interdiffusion experiments with selectively deuterated HDH/DHD polymer interfaces using dynamic secondary ion mass spectroscopy (DSIMS - see Secondary ion mass spectrometry) and neutron reflectivity. The scaling laws for interdigitation and the complete concentration profiles for Rouse and reptation dynamics have also been calculated. ... 

Dynamic SIMS Dynamic Secondary Ion Mass Spectroscopy Surface Ion beam (1-20 keV) Secondary ions analysis with mass spectrometer 2nm-1 pm (or deeper ion milling) 0.50 nm Elemenlal and isolopic analysis depth profile (all elements) detection limits ppb-ppm 4... 

Scheme 9.1 Methods in morphology characterization. TEM transmission electron microscopy EF-TEM energy filter transmission electron microscopy STXM scan transmission X-ray microscopy GISAXS grazing incidence small-angle X-ray scattering SANS small-angle neutron scattering RSoXS resonant soft X-ray scattering SEM scanning electron microscopy DSIMS dynamic secondary ion mass spectroscopy XR X-ray reflectivity NR neutron reflectivity VASE variable angle spectroscopic ellipsometry.

High-resolution electron-energy loss spectroscopy Static secondary-ion mass spectroscopy Dynamic secondary-ion mass spectroscopy Forward recoil spectroscopy... 

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