Dynamic secondary ion mass spectroscopy DSIMS

Figure 8 shows the time evolution of interfacial thickness for the PS/dPS bilayer as a function of temperature [40]. The of both PS and dPS was fixed at 29k. The interfacial characterization was made by dynamic secondary ion mass spectroscopy (DSIMS). In the case of aimealing at 400, 393, and 380 K (i.e., above the 7 of 376 K), the interfacial thickness proportionally increased to a half power of the annealing time. This is in good accordance with the context of Fickian diffusion. By contrast, a unique interfacial evolution was observed at 370 K (i.e., between 7 and T ). At first, the bilayer interface monotonically thickened with increasing time,... 

The reptation dynamics and the interface structure relations in Table 2 have been demonstrated experimentally by a series of interdiffusion experiments with selectively deuterated HDH/DHD polymer interfaces using dynamic secondary ion mass spectroscopy (DSIMS - see Secondary ion mass spectrometry) and neutron reflectivity. The scaling laws for interdigitation and the complete concentration profiles for Rouse and reptation dynamics have also been calculated. ... 

Scheme 9.1 Methods in morphology characterization. TEM transmission electron microscopy EF-TEM energy filter transmission electron microscopy STXM scan transmission X-ray microscopy GISAXS grazing incidence small-angle X-ray scattering SANS small-angle neutron scattering RSoXS resonant soft X-ray scattering SEM scanning electron microscopy DSIMS dynamic secondary ion mass spectroscopy XR X-ray reflectivity NR neutron reflectivity VASE variable angle spectroscopic ellipsometry.

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