Time-of-flight secondary ion mass spectroscopy ToF SIMS

The time-of-flight secondary ion mass spectroscopy (ToF-SIMS) analysis was performed on a CAMECA ION-TOF Model IV spectrometer. This instrument was equipped with a reflection-type ToF mass analyzer and a pulsed 25 kV primary... 

Time-of-flight secondary ion mass spectroscopy (TOF-SIMS)15 has been used for observing the initiating species in anionic ring-opening polymerizations of D3. The PDMS mass spectrum shows peaks of varying intensity with local maxima every 3 silicon repeat units. This distribution is attributed to the relative concentrations of the three initiating species, II, 12 and 13, shown in equation 2 which can be determined from the peak intensities. 

This chapter describes the results of an ongoing study we are conducting into the nanoscale mechanical properties, chemical composition and structure of healthy enamel, carious lesions and the acquired salivary pellicle layer. A variety of material characterization techniques are being used, including nanoindentation, scanning electron microscopy (SEM), electron microprobe analysis (EMPA), scanning acoustic microscopy, atomic force microscopy (AFM) and time-of-flight secondary ion mass spectroscopy (TOF SIMS). 

Figure 7.4. Time-of-flight secondary-ion mass spectroscopy (ToF-SIMS) image of the distribution of Fe on a cross section of a trembling aspen (Populus tremuloi desMmchx ) root embedded in clayey soil material. The Fe values are normalized to the total ion yield of the surface. The bar is 100 (im. (From Martin et al., 2004.)...

Over the last decade, SIMS and XPS have been shown to be powerful complementary techniques for determining the interfacial chemistries of polymers [68]. The surface chemical structure of aliphatic polyanhydride films has been examined using time-of-flight secondary ion mass spectroscopy (ToF-SIMS) and X-ray photoelectron spectroscopy (XPS) [65, 66]. The Cls and Ols core level spectra are displayed for the homologous series of aliphatic polyanhydrides in Fig. 12. The main peak at 285 eV corresponds to the C-H. The peak at 289.5 eV arises from 0-C=0. The XPS data confirmed the purity of the surface, and the experimental surface elemental ratios were in good general agreement with the known stoichiometry of polyanhydrides. 

Time-of-flight secondary-ion mass spectroscopy (TOF-SIMS)... 

Direct measurement of the adsorbed particles has proven difficult because of their weak binding to the surface. Nevertheless, the adsorbed colloidal particles have been detected by ion microprobe analysis [8], atomic force microscopy (AFM) [9, 10] and time-of-flight secondary ion mass spectroscopy (ToF-SIMS) [10]. AFM results ofVan Roy and coworkers ]10] are shown in Fig. 3, along with their proposed nucleation and growth mechanism on the aluminum surface. These results demonstrate that under the conditions of these experiments, the adsorbed particles are flat with 7 to 8 nm thickness and 100 to 300 nm in diameter. According... 

We first have confirmed the presence of polymeric materials in the SEI by Fourier transform infrared spectroscopy (FTIR), X-ray photoelectron spectroscopy (XPS), time of flight-secondary ion mass spectroscopy (TOF-SIMS), and proton nuclear magnetic resonance spectroscopy ( H-NMR), as exemplified in Figs. 4.7 and 4.8. The FTIR and XPS (01s) spectra indicated the presence of C = C bonds and polymeric materials, respectively. The TOF-SIMS revealed the existence of... 

XPS results verified the formation of biofllm containing extracellular polymers on 304 SS exposed to Burkholderia sp. Changes in the relative Fe concentration and Fe 2p peak shape indicated also that iron had accumulated in the film. Time-of-flight secondary ion mass spectroscopy (ToF-SIMS) and XPS were employed to investigate the interactions between EPS from SRB of the genus Desulfuvibrio, and Fe ions released from steel. ... 

Time-of-flight secondary ion mass spectroscopy (TOF-SIMS) is a powerful method for investigating modified surfaces based on mass spectrometric analysis. 

Depth profiling of automotive parts containing calcium stearate and zinc stearate was done by photoelectron spectroscopy, ESCA. " The depth thickness of measurement was 5 nm. Using time of flight secondary ion mass spectroscopy, ToF-SIMS, the depth thickness monitored was 1 nm. The ToF SIMS technique was used to measure the relative concentration of erucamide as a function of depth for a pol mier film at equilibrium." ESCA data gave useful information on migration of stearates to the surface. " ... 

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