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Microscopy, scanning force

SFM was performed on a Nanoscope IV Bioscope (Veeco). The microscope was vibration- and acoustic-damped (Brunhild II, Veeco). Commercially available pyramidal Si3N4 tips (Veeco) on a V-cantilever (length 125 pm) were used for the force measurements. For the force measurements with attached ECs, the tip was removed mechanically from the cantilever. The measurements were done in contact mode with PBS (pH 7.4) medium. The force constants of the cantilevers were determined according to Florin et al. [37] and were in the range [Pg.162]

The visualization of the protein modification was performed under normal atmospheric conditions, at a temperature of 25 °C and with a humidity of approx. [Pg.163]

We used commercially available pyramidal Si3N4 tips (NCH-W, Digital Instruments, Santa Barbara, CA) in tapping mode with a scan frequency between [Pg.163]

The force required to resist the dampening can be detected by a feedback mechanism and related to topographical or structural information as the tip is scanned laterally over the specimen. The major advantage of this mode of operation is that the specimen experiences a minimum of lateral distortion by the scanning tip. [Pg.346]


SFM Scanning force microscopy Another name for AFM Surface structure... [Pg.313]

Muiier-Zuiow B, Kipp S, Lacmann R and Schneeweiss M A 1994 Topoiogicai aspects of iron corrosion in aikaiine soiution by means of scanning force microscopy (SFM) Surf. Sol. 311 153... [Pg.1723]

Welter O, Bayer T and Greschner J 1991 Micromachined silicon sensors for scanning force microscopy J. Vac. Sc/. Technol. B 9 1353... [Pg.1723]

Sheiko S S, Moller M, Reuvekamp E M C M and Zandbergen H W 1993 Calibration and evaluation of scanning-force-microscopy probes Phys. Rev. B 48 5675... [Pg.1724]

Roberts C J, Williams P M, Davies J, Dawkes A C, Sefton J, Edwards J C, Haymes A G, Bestwick C, Davies M C and Tendler S J B 1995 Real-space differentiation of IgG and IgM antibodies deposited on microtiter wells by scanning force microscopy Langmuir 1822... [Pg.1724]

Bustamente C, Vesenka J, Tang C L, Rees W, Guthold M and Keller R 1992 Circular DMA molecules imaged in air by scanning force microscopy Biochemistry 22... [Pg.1727]

Keller D and Chou C C 1992 Imaging steep, high structures by scanning force microscopy with electron beam deposited tips Surf. Sol. 268 333... [Pg.1727]

Bustamente C, Keller D and Yang G 1993 Scanning force microscopy of nucleic acids and nucleoprotein assemblies Curr. Opin. Struct. Biol. 3 363... [Pg.1727]

Rees WA, Keller R W, Vesenka J P, Yang G and Bustamente C 1993 Evidence of DMA bending in transcription complexes imaged by scanning force microscopy Sc/e/ ce 260 1646... [Pg.1727]

Feldman K, Hahner G, Spencer N D, Harder P, and Grunze M 1999 Probing resistance to protein adsorption of oligo(ethylene glycol)-terminated self-assembled monolayers by scanning force microscopy J. Am. Chem. Soc. at press... [Pg.2640]

Koutsos V, van der Vegte E W, Pelletier E, Stamouli A and Hadziioannou G 1997 Structure of chemically end-grafted polymer chains studied by scanning force microscopy in bad-solvent conditions Macromolecules 30 4719-26... [Pg.2641]

Koutsos V, van der Vegte E W and Hadziioannou G 1999 Direct view of structural regimes of end-grafted polymer monolayers a scanning force microscopy study Macromolecules 32 1233-6... [Pg.2641]

Scanning Tunneling Microscopy and Scanning Force Microscopy (STM and SFM)... [Pg.9]

Secondary Electron Microscopy with Polarization Analysis Scanning Force Microscopy Scanning Force Microscope... [Pg.768]

RosaZeiser, A., Weilandt, E., Hild, S. and Marti, O., The simultaneous measurement of elastic, electrostatic and adhesive properties by scanning force microscopy pulsed-force mode operation. Measur. Sci. Techno ., 8(11), 1333-1338 (1997). [Pg.217]

Tamayo, J. and Garcia, R., Effects of elastic and inelastic interactions on phase contrast images in tapping-mode scanning force microscopy. Appl. Phys. Lett., 71(16), 2394-2396 (1997). [Pg.217]

Tamayo, J. and Garcia, R., Relationship between phase shift and energy dissipation in tapping-mode scanning force microscopy. Appl Phys. Lett., 73(20), 2926-2928 (1998). Gotsmann, B., Seidel, C., Anezykowski, B. and Fuchs, H., Conservative and dissipative tip-sample interaction forces probed with dynamic AFM. Phys. Rev. B Condens. Matter, 60, 11051-11061 (1999). [Pg.217]

Unertl, W.N., Implications of contact mechanics models for mechanical properties measurements using scanning force microscopy. J. Vac. Sci. Technol. A Vac. Surf. Films, 17(4), 1779-1786(1999). [Pg.218]

VasUeios, K., "Physical Properties of Grafted Polymer Mono-layers Studied by Scanning Force Microscopy Morphology, Friction, Elasticity, Dissertations, University of Groningen, Denmark, 1997. [Pg.34]

FIG. 18 Scanning force microscopy images, (a) C60 transferred horizontally onto highly oriented pyrolytic graphite (HOPG) at 25 mN m. (b) 1 1 mixed film of C60 and arachidic acid transferred horizontally onto HOPG at 25 mN m. (Reproduced with permission from Ref. 235. Copyright 1996 American Chemical Society.)... [Pg.102]

Fulda and coworkers [92,93], Bliznyuk and Tsukruk [94], and Serizawa and coworkers [95-97] were the first who tried to use this technique for the preparation of ordered bi- and multilayer assemblies of oppositely charged latex particles. The structure was investigated using scanning force microscopy (SFM) and SEM. In a further publication, Kampes and Tieke [98] studied the influence of the preparation conditions on the state of order of the monolayers. In the following section, the recent studies are more extensively reviewed. [Pg.229]

Scanning force microscopy (SFM) is the only tool that allows one to image S-layer protein monolayers on solid supports at molecular resolution (Fig. lb and c) [22-25]. In particular, SFM in contact mode under water with loading forces in the range of <500 pN leads to an image resolution in the subnanometer range (0.5-1.0 nm). [Pg.359]


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Atomic force microscopy contact scanning mode

Atomic force microscopy scanning modes

Atomic force microscopy scanning probe instrument

Atomic force microscopy scanning tunnel microscopes

Atomic force microscopy vibration scanning mode

Developing scanning force microscopy

Raster-scanned scanning force microscopy

Scanning Kelvin probe force microscopy

Scanning Kelvin probe force microscopy SKPFM)

Scanning electrochemical microscopy shear force

Scanning force microscopy (SEM)

Scanning force microscopy , for

Scanning force microscopy combined with SECM

Scanning force microscopy images

Scanning force microscopy mode

Scanning force microscopy polymer surfaces

Scanning force microscopy, SFM

Scanning force microscopy, enhanced

Scanning force modulation microscopy

Scanning polarization force microscopy

Scanning polarization force microscopy SPFM)

Scanning probe microscopes force microscopy

Scanning probe techniques atomic force microscopy

Scanning probe techniques electric force microscopy

Surface analysis scanning force microscopy

Typical scanning force microscopy

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