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Scanning force modulation microscopy

Figure 5.21 Cross-section of carbon fibers in an epoxy matrix (a) topographic image and (b) force modulation image. The image width is 32 //m. (Reproduced with permission from R. Wiesendanger, Scanning Probe Microscopy and Spectroscopy, Cambridge University Press, Cambridge, UK. 1994 Cambridge University Press.)... Figure 5.21 Cross-section of carbon fibers in an epoxy matrix (a) topographic image and (b) force modulation image. The image width is 32 //m. (Reproduced with permission from R. Wiesendanger, Scanning Probe Microscopy and Spectroscopy, Cambridge University Press, Cambridge, UK. 1994 Cambridge University Press.)...
Force Modulation Mode Contact Electric Force Microscopy (EFM) Young s Modulus Microscopy (YMM) Scanning near-field acoustic Force-distance measurements... [Pg.358]

First attempts to record the micro/nanomechanical surface properties with atomic force microscopy/scanning probe microscopy (AFM/SPM) probing were conducted by using the classical Sneddon s approach [1-3]. Further development lead to the micromapping of the surface mechanical properties with a force modulation mode [4-8]. Several studies were focused on the development of dc force-displacement probing of the micromechanical properties [9-15]. In this communication, we report on studies of the micromechanical properties of composite films of polystyrene/polybutadiene (PS/PB) and grafted PS layers and prove the feasibility of... [Pg.254]

Bocker, M. Anczykowski, B. Wegener, J. Schaffer, T. E., Scanning ion conductance microscopy with distance-modulated shear force control. Nanotechnology 2007, 18, 145505-145506. [Pg.109]

Krotil HU, Stifter T, Marti O. Concurrent measurement of adhesive and elastic surface properties with a new modulation technique for scanning force microscopy. Rev Sci Instrum 2000 71 2765. [Pg.116]

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