SFM = scanning force microscopy

Muiier-Zuiow B, Kipp S, Lacmann R and Schneeweiss M A 1994 Topoiogicai aspects of iron corrosion in aikaiine soiution by means of scanning force microscopy (SFM) Surf. Sol. 311 153... 

Fulda and coworkers [92,93], Bliznyuk and Tsukruk [94], and Serizawa and coworkers [95-97] were the first who tried to use this technique for the preparation of ordered bi- and multilayer assemblies of oppositely charged latex particles. The structure was investigated using scanning force microscopy (SFM) and SEM. In a further publication, Kampes and Tieke [98] studied the influence of the preparation conditions on the state of order of the monolayers. In the following section, the recent studies are more extensively reviewed. 

Scanning force microscopy (SFM) is the only tool that allows one to image S-layer protein monolayers on solid supports at molecular resolution (Fig. lb and c) [22-25]. In particular, SFM in contact mode under water with loading forces in the range of <500 pN leads to an image resolution in the subnanometer range (0.5-1.0 nm). 

Atomic force microscopy (AFM) or, as it is also called, scanning force microscopy (SFM) is based on the minute but detectable forces - of the order of nano Newtons -between a sharp tip and atoms on the surface. The tip is mounted on a flexible arm, called a cantilever, and is positioned at a subnanometre distance from the surface. If the sample is scanned under the tip in the x-y plane, it feels the attractive or repulsive force from the surface atoms and hence it is deflected in the z-direction. The deflection can be measured with a laser and photo detectors as indicated schematically in Fig. 4.29. Atomic force microscopy can be applied in two ways. 

Munz, M., Cappella, B., Sturm, H., Geuss, M. and Schulz, E. Materials Contrasts and Nanolithography Techniques in Scanning Force Microscopy (SFM) and their Application to Polymers and Polymer Composites. Vol. 164, pp. 87-210. 

The microdomain orientation as a function of the electric field strength was monitored by a series of scanning force microscopy (SFM) images taken in the center between the electrodes. The entire electrode length of 6 mm was screened in steps of a few tens of microns. From the azimuthal intensity distribution of the 2D Fourier transformations of the SFM images, the orientational order parameter P2 was calculated according to ... 

Therefore we propose here an alternative route to inspect the local dielectric and polarization properties using non-destructive and non-invasive methods based on scanning force microscopy (sfm). Simultaneously, these techniques offer a high resolution in real space being extended down to the atomic scale when inspecting ferroelectric systems under ultra-high... 

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