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Scanning probe techniques electric force microscopy

Many-pass techniques Electric Force Microscopy (EFM) Scanning Capacitance Microscopy (SCaM) Kelvin Probe Microscopy (SKM) DC Magnetic Force Microscopy (DC MFM) AC Magnetic Force Microscopy (AC MFM) Dissipation Force Microscopy-Scanning Surface Potential Microscopy (SSPM) Scanning Maxwell Stress Microscpy (SMMM) Magnetic Force Microscopy (MFM) Van der Waals Force Microscopy (VDWFM)... [Pg.358]

Scanned probe microscopies (SPM) that are capable of measuring either current or electrical potential are promising for in situ characterization of nanoscale energy storage cells. Mass transfer, electrical conductivity, and the electrochemical activity of anode and cathode materials can be directly quantified by these techniques. Two examples of this class of SPM are scanning electrochemical microscopy (SECM) and current-sensing atomic force microscopy (CAFM), both of which are commercially available. [Pg.241]

A wide variety of measurements ean now be made on single molecules, including electrical (e.g. scanning tunnelling microscopy), magnetic (e.g. spin resonance), force (e.g. atomie force microscopy), optical (e.g. nearfield and far-field fluorescence mieroscopies) and hybrid techniques. This contribution addresses only those techniques that are at least partially optical. Single-particle electrical and force measurements are discussed in the sections on scanning probe microscopies (B1.19) and surface forees apparatus (B1.20). [Pg.2483]

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See also in sourсe #XX -- [ Pg.310 , Pg.316 ]

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Electric force

Electrical probes

Force probe

Microscopy techniques

Probe microscopy

Probe techniques

Scanning force microscopy

Scanning probe

Scanning probe microscopy

Scanning probe microscopy techniques

Scanning probe techniques

Technique scanning