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Shear Force Scanning Electrochemical Microscopy

A Hengstenberg, C Kranz, W Schuhmann. Facilitated tip-positioning and application of non-electrode tips in scanning electrochemical microscopy using a shear force-based constant-distance mode. Chem Eur J 6 1547-1554, 2000. [Pg.519]

Ballesteros Katemann B, Schulte A, Schuhmann W (2003) Constant-distance mode scanning electrochemical microscopy (SECM)-Part 1 adaptation of a non-optical shear-force-based positioning mode for SECM tips. Chem Eur J 9(9) 2025-2033... [Pg.142]

Yamada, H., Y. Ikuta, T. Koike, and T. Matsue, Eabrication of a shear force-based ion-selective capillary probe for scanning electrochemical microscopy, Chem. Lett., Vol. 37, 2008 pp. 392-393. [Pg.62]

Tefashe, U. M. and Wittstock, G. 2013. Quantitative characterization of shear force regulation for scanning electrochemical microscopy. C. R. Chimie 16 7—14. [Pg.786]

Garay, M. R, Ufheil, J., Borgwarth, K., Heinze, J. Retrospective chemical analysis of tree rings by means of the scanning electrochemical microscopy with shear force feedback. PCCP 2004, 6,4028-4033. [Pg.414]

Etienne, M., Anderson, E. C., Evans, S. R., Schuhmann, W., Eritsch, 1., Eeedback-independent Pt nanoelectrodes for shear force-based constant-distance mode scanning electrochemical microscopy. Anal. Chem. 2006, 78, 7317-7324. [Pg.629]

Bitchier, M., Kellye, S. C., Smyrl, W. H., Scanning electrochemical microscopy with shear force feedback. Investigation of the lateral resolution of different experimental configurations. Electrochem. Solid State Lett. 2000, 3, 35-38. [Pg.629]

Lee, Y., Z. Ding, A.J. Bard. 2002. Combined scanning electrochemical/optical microscopy with shear force and current feedback. Anal. Chem. 74 3634-3643. [Pg.181]

Takahashi, Y Shiku, H. Murata, T. Yasukawa, T. Matsue, T. 2009. Transfected single-cell imaging by scanning electrochemical optical microscopy with shear force feedback regulation. Anal. Chem., 81, 9674-9681. [Pg.687]


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