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Scanning force microscopy mode

RosaZeiser, A., Weilandt, E., Hild, S. and Marti, O., The simultaneous measurement of elastic, electrostatic and adhesive properties by scanning force microscopy pulsed-force mode operation. Measur. Sci. Techno ., 8(11), 1333-1338 (1997). [Pg.217]

Tamayo, J. and Garcia, R., Effects of elastic and inelastic interactions on phase contrast images in tapping-mode scanning force microscopy. Appl. Phys. Lett., 71(16), 2394-2396 (1997). [Pg.217]

Tamayo, J. and Garcia, R., Relationship between phase shift and energy dissipation in tapping-mode scanning force microscopy. Appl Phys. Lett., 73(20), 2926-2928 (1998). Gotsmann, B., Seidel, C., Anezykowski, B. and Fuchs, H., Conservative and dissipative tip-sample interaction forces probed with dynamic AFM. Phys. Rev. B Condens. Matter, 60, 11051-11061 (1999). [Pg.217]

Scanning force microscopy (SFM) is the only tool that allows one to image S-layer protein monolayers on solid supports at molecular resolution (Fig. lb and c) [22-25]. In particular, SFM in contact mode under water with loading forces in the range of <500 pN leads to an image resolution in the subnanometer range (0.5-1.0 nm). [Pg.359]

Leuba, S.H., Yang, G., Robert, C., Samori, B., van Holde, K., Zlatanova, J., and Bustamante, C. (1994) Three-dimensional structure of extended chromatin fibers as revealed by tapping-mode scanning force microscopy. Proc. Nat. Acad. Sci. USA 91, 11621-11625. [Pg.71]

For many reasons, the tapping mode is one of the most versatile developments in scanning force microscopy [ 114]. It was originally introduced for stable imaging at ambient conditions as the probe penetrates the contamination layer rapidly and intermittently. Besides that, there are three other key advantages of... [Pg.80]

Scanning force microscopy (SFM) 87 Scanning mode 155 Scanning probe microscopy (SPM) 94 Scanning spreading resistance microscopy (SSRM) 171... [Pg.230]

Figure 3a, b. Topographic scanning force microscopy (SFM) images (tapping mode) of monomolecular films of dendron-bearing polystyrene a) I ) ... [Pg.310]

Figure 17.7 Scanning force microscopy images taken in non-contact mode for neat C o and CuPc films as well as for three mixed films grown at 375 K. The total image size is 2 x 2 pm. The max. height is given as the difference between the lowest value (dark blue) and the highest value (white) in each of the images. Figure 17.7 Scanning force microscopy images taken in non-contact mode for neat C o and CuPc films as well as for three mixed films grown at 375 K. The total image size is 2 x 2 pm. The max. height is given as the difference between the lowest value (dark blue) and the highest value (white) in each of the images.
Scanning force microscopy (SFM) images were obtained with a Digital Instmments Nanoscope Ilia in tapping mode. [Pg.350]

Abstract In this review, we show the distribution of glass transition temperature (Tg) in monodisperse polystyrene (PS) films coated on silicon oxide layers along the direction normal to the surface. Scanning force microscopy with a lateral force mode revealed that surface T (Tl) was lower than the corresponding bulk T, (T ). [Pg.2]

As an analytical tool for such a chemically patterned SAM surface, pulsed-force-mode atomic force microscopy (PFM-AFM) designed by Marti and coworkers [349] is useful as scanning force microscopy with chemical recognition capability [350, 351] (see chemical force... [Pg.6231]

Fig. 2.5 Schematic set-up of scanning force microscopy and modes of operation variation in surface properties are detected via the deflection of the cantilever with probing tip... Fig. 2.5 Schematic set-up of scanning force microscopy and modes of operation variation in surface properties are detected via the deflection of the cantilever with probing tip...
Keywords atomic force microscopy (AFM), structure, morphology, spherulite, hedrite, lamella, conformation, chain packing, films, scanning force microscopy (SFM), tapping mode, syndiotactic PP, (3-PP, transcrystallinity, corona treatment, biaxial orientation. [Pg.518]

Within the numerous proximal probe techniques developed in the years following the breakthrough inventions of the STM (1) and AFM (5), scanning force microscopy (8) represents a family of scanning probe techniques that rely in their contrast mechanism on various forces between probe tip and sample (9-12) (see Atomic Force Microscopy). In order to provide a basis for an understanding and appreciation of the SFM work on polymers (13-18), as presented in this review, the basic principles of SFM, as well as selected imaging modes, are briefly discussed. [Pg.7445]


See other pages where Scanning force microscopy mode is mentioned: [Pg.28]    [Pg.204]    [Pg.26]    [Pg.345]    [Pg.657]    [Pg.932]    [Pg.189]    [Pg.187]    [Pg.75]    [Pg.84]    [Pg.595]    [Pg.310]    [Pg.45]    [Pg.920]    [Pg.921]    [Pg.508]    [Pg.203]    [Pg.920]    [Pg.921]    [Pg.14]    [Pg.779]    [Pg.286]    [Pg.511]    [Pg.252]    [Pg.665]    [Pg.251]   
See also in sourсe #XX -- [ Pg.349 ]




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Atomic force microscopy contact scanning mode

Atomic force microscopy scanning modes

Atomic force microscopy vibration scanning mode

SCAN mode

Scanning force microscopy

Scanning modes

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