Scanning force microscopy SEM

Eggleston, C.M. and Jordan, G., A new approach to pH of point of zero charge measiuement Crystal-face specificity by scanning force microscopy (SEM), Geochim. Cosmochim. Acta. 62. 1919, 1998. 

In atomic force microscopy (AFM, Table 32.3), also known as scanning force microscopy (SEM), a small, sharp tip scans the surface of a sample. The tip is located at the free end of a cantilever. Interaction forces between the tip and the sample surface cause the cantilever to bend or deflect. A detector measures the cantilever deflections, and a three-dimensional map of the surface topography of the sample is generated based on the measured deflections (Bowen et al., 1999 Reich et al., 2001 Yalamanchili et al., 1998). 

Fulda and coworkers [92,93], Bliznyuk and Tsukruk [94], and Serizawa and coworkers [95-97] were the first who tried to use this technique for the preparation of ordered bi- and multilayer assemblies of oppositely charged latex particles. The structure was investigated using scanning force microscopy (SFM) and SEM. In a further publication, Kampes and Tieke [98] studied the influence of the preparation conditions on the state of order of the monolayers. In the following section, the recent studies are more extensively reviewed. 

The experimental tools for this research were chronopotetiometry (galvanostatic cycling),25 atomic force microscopy (AFM),26,27 scanning electron microscopy (SEM), and X-ray diffraction (XRD).21,25 It should be mentioned that the AFM imaging was conducted in-situ under potential control and in a special homemade glove box filled with highly pure argon atmosphere. This system has been already described in detail in the literature.28... 

Microscopic techniques, 70 428 Microscopists, role of, 76 467 Microscopy, 76 464-509, See also Atomic force microscopy (AFM) Electron microscopy Light microscopy Microscopes Scanning electron microscopy (SEM) Transmission electron microscopy (TEM) acronyms related to, 76 506-507 atomic force, 76 499-501 atom probe, 76 503 cathodoluminescence, 76 484 confocal, 76 483-484 electron, 76 487-495 in examining trace evidence, 72 99 field emission, 76 503 field ion, 76 503 fluorescence, 76 483 near-held scanning optical,... 

In addition to surface analytical techniques, microscopy, such as scanning electron microscopy (SEM), transmission electron microscopy (TEM), scanning tunneling microscopy (STM) and atomic force microscopy (AFM), also provide invaluable information regarding the surface morphology, physico-chemical interaction at the fiber-matrix interface region, surface depth profile and concentration of elements. It is beyond the scope of this book to present details of all these microscopic techniques. 

Thermochemistry DSC (see Box 9.1) TGA (see Box 9.1) Vapour pressure measurements Solid-state NMR Ultramicroscopy Scanning electron microscopy (SEM) Tunnelling electron microscopy (TEM) Atomic force microscopy (AFM) Molecular dynamics... 

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