Atomic force microscopy scanning probe instrument

Only recent developments in instrumentation of scanning probe microscopy, such as scanning tunneling microscopy (8) and atomic force microscopy (9), have made it possible to study friction on the nanometer and higher scales. These experiments show that the behavior on the single asperity level is different from that on the macroscopic scale. 

The quartz crystal nanobalance (QCN) can be combined with practically any electrochemical methods, such as cyclic voltammetry, chronoamperometry, chronocoulometry, potentiostatic, galvanostatic, rotating disc electrode [11], or potentiometric measurements. The EQCN can be further combined with other techniques, e.g., with UV-Vis spectroscopy [12], probe beam deflection (PBD) [13], radiotracer [14], atomic force microscopy (AEM) [15], and scanning electrochemical microscopy (SECM) [16]. The concept and the instrumentation of... 

Atomic Force Microscopy (AFM). AFM measurements were performed with a commercial scanning probe microscope (Nanoscope III, Digital Instruments, Santa Barbara, CA). Measurements of surface topography and lateral force were made simultaneously by operating the instrument in contact mode while scanning the cantilever laterally. All measurements were performed in ambient air on freshly plasma cleaned samples. 

Atomic force microscopy (AFM) images were obtained using a Digital Instruments MultiMode scanning probe microscope with a NanoScope IVa controller (Veeco Instruments, Santa Barbara, CA) in tapping mode. A silicon probe (Veeco) with an end radius of <10 run and a force constant of 5 N/m was used to image sanples. Samples were dried under vacuum at 60 °C for 3 h and... 

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