Scanning atomic force microscopy

Atomic Force Microscopy Scanning Probe Microscopy... 

Cohen SH, Bray MT, Lightbody ML. Atomic Force Microscopy-Scanning Tunneling Microscopy. Proceedings of the first U.S. Army Natik Research Development and Engineering Center. Plenum Press, New York, 1995. 

L.M. Do, E.H. Han, Y. Niidome, and M. Fujihira, Observation of degradation processes of A1 electrodes in organic electroluminescence devices by electroluminescence microscopy, atomic force microscopy, scanning electron microscopy, and Auger electron spectroscopy, J. Appl. Phys., 76 5118-5121, 1994. 

Mavrocordatos D, Pronk W, Boiler M (2004) Analysis of environmental particles by atomic force microscopy, scanning and transmission electron microscopy. Water Sci Technol 50 9-18... 

Tortonese M (1997) In Cohen SH, Lightbody ML (eds) Atomic Force Microscopy / Scanning Tunneling Microscopy. Vol 2, Plenum, New York, p 147... 

Pyrex, soda Atomic force microscopy, scanning... 

Homogeneity size exclusion chromatography (SEC) coupled with low-angle laser light scattering (SEC-LALLS) electron microscopy, atomic force microscopy, scanning tunnel microscopy capillary electrophoresis. 

F. Caruso, D.N. Furlong, K. Ariga, I. Ichinose, T. Kimitake, Characterization of Polyelectrolyte-Protein Multilayer Films by Atomic Force Microscopy, Scanning Electron Microscopy, and Fourier Transform Infrared Reflection-Absorption Spectroscopy , Langmuir, 14,4559 (1998)... 

Atomic force microscopy. Scanning electron microscopes do not provide the necessary resolution for analyzing detail morphology of certain membrane layers of very fine pore sizes such as those suitable for ultrafiltration and gas separation. While transmission electron microscopes are capable of examining very small scale structures, the technique is limited to only very thin specimens. This makes sample preparation for a multilayered membrane very difficult and tedious. 

See atomic force microscopy scanning tunneling microscope. 

Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching... 

Fig. 2. Atomic force microscopy scans and profiles of the surface structures formed by PSP deposited on the as prepared (a,b) and pre UV illuminated (c,d) PPNB surface. Scan size is 2x2 pm.

Macromolecular structure Electron microscopy, atomic force microscopy, scanning tunneling microscopy and light scattering. 

Barrow, M.S., Jones, R.L., Park, J.O., Srinivasarao, M., Williams, P.R., Wright, C.J. Physical characterisation of microporous and nanoporous polymer films by atomic force microscopy, scanning electron microscopy and high speed video microphotography. Spectroscopy 18, 577-585 (2004)... 

Transmission Electron Microscopy Scanning Electron Microscopy Field Ion Microscopy Atomic Force Microscopy Scanning Hinneling Microscopy High Resolution STM X-ray Fluorescence Microscopy... 

AFM/SPM Atomic Force Microscopy Scanning Probe Microscopy Surface imaging with near atomic spatial resolution Atomic scale morphology 0.1 A 50 A... 

Cohen SH, Lightbody ML, Foundation for Advances in Medicine and Science. Atomic force microscopy/scanning tunneling microscopy 3. New York Kluwer Academic/Plenum Publishers 1999. viii, 210 p. p. 

First attempts to record the micro/nanomechanical surface properties with atomic force microscopy/scanning probe microscopy (AFM/SPM) probing were conducted by using the classical Sneddon s approach [1-3]. Further development lead to the micromapping of the surface mechanical properties with a force modulation mode [4-8]. Several studies were focused on the development of dc force-displacement probing of the micromechanical properties [9-15]. In this communication, we report on studies of the micromechanical properties of composite films of polystyrene/polybutadiene (PS/PB) and grafted PS layers and prove the feasibility of... 

Fig. 8.27. The graph on the right shows an atomic force microscopy scan in the miscut direction of the surface of a Sio.sGeo.s deposit, nominally 2.5 nm in thickness, on a vicinal Si(OOl) surface miscut at 4.34° the deposition temperature was 650 °C. Reproduced with permission from Schelling et al. (2001). The growth surface retains the average slope of the miscut surface, represented by 0 in the sketch on the left, but it is divided into segments with slopes of either +6 or —6, representing the minima in surface energy for the strained stepped surface.

Several other modern techniques are also available to investigate the state of the suspension Freeze-fracture and electron microscopy, atomic force microscopy, scanning tunneling microscopy and confocal laser microscopy. 

S. H. Cohen, M.T. Bray and M.L. Lightbody (eds.). Atomic Force Microscopy/Scanning Tunneling Microscopy, Plenum, New York, NY (1994). 

The relationship between nanoparticle size and the LSPR extinction maximum, A- ax. has been recognized, though not fully understood, for many years. As atomic force microscopy, scanning electron microscopy, and tunneling electron microscopy have... 

Fig. 13 Atomic force microscopy scan of a superhelix formed from a sequence specific 15-mer with alternating hydrophobic and anionic moieties. Reproduced, with modifications from [112], with permission from the American Chemical Society...

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