Electron microscopy Secondary

Secondary Electron Microscopy with Polarization Analysis Scanning Force Microscopy Scanning Force Microscope... 

PC Schmidt. Secondary electron microscopy in pharmaceutical technology, In J Swarbrick, JC Boylan, eds. Encyclopedia of Pharmaceutical Technology, Vol. 19. New York Marcel Dekker, 2000, pp 311-356. 

The most frequently applied analytical methods used for characterizing bulk and layered systems (wafers and layers for microelectronics see the example in the schematic on the right-hand side) are summarized in Figure 9.4. Besides mass spectrometric techniques there are a multitude of alternative powerful analytical techniques for characterizing such multi-layered systems. The analytical methods used for determining trace and ultratrace elements in, for example, high purity materials for microelectronic applications include AAS (atomic absorption spectrometry), XRF (X-ray fluorescence analysis), ICP-OES (optical emission spectroscopy with inductively coupled plasma), NAA (neutron activation analysis) and others. For the characterization of layered systems or for the determination of surface contamination, XPS (X-ray photon electron spectroscopy), SEM-EDX (secondary electron microscopy combined with energy disperse X-ray analysis) and... 

MPa (A) backscatter (BSE) micrograph differentiation of the alloy into in its compounds (here Bismuth and Cadmium), (B) SEM (secondary electron microscopy) micrograph WM... 

The surface morphology of grains has been studied by secondary electron microscopy (SEM) (Hoppe et al., 1995). Such studies have been especially useful for pristine SiC grains that have not been subjected to any chemical treatment (Bernatowicz et al., 2003). Finally, the transmission electron microscope (TEM) played an important role in the discovery of presolar SiC (Bernatowicz et al., 1987) and internal TiC and other subgrains in graphite (Bernatowicz et al., 1991). It has also been successfully applied to the study of diamonds (Daulton et al., 1996) and of polytypes of SiC (Daulton et al., 2002, 2003). 

In secondary electron microscopy (SEM), in most cases, SEs are used for imaging. BSE detectors are closely connected with element analysis of the specimen. Other types are more or less seldom used in electron microscopy. In transmission electron microscopy (TEM), TEs will be processed to give an image. 

Secondary Electron Microscopy in Pharmaceutical Technology Crushing strength(N)... 

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