Scanning force microscopy, enhanced

Enhanced Metal Nucleation with Self-Assembled Monolayers of a -Substituted Silanes Studied by Scanning Force Microscopy... 

The parallel developments of scanning tunneling microscopy (STM) (12) and atomic force microscopy (AFM) (13) greatly broaden our perspectives and abilities to probe the shape and electronic structure of individual supported clusters, as well as enhance our ability to manipulate these entitles on the atomic scale. 

The WITec alpha300 R confocal Raman microscope can be upgraded to perform atomic force microscopy (AFM), tip-enhanced Raman spectrometry and near-field scanning optical microscopy, and is arguably the most versatile instrument for Raman microspectroscopy available today. 

Summary. We describe work from our group utilizing in-situ scanning tunneling microscopy and atomic force microscopy in conjimction with additional surface characterization techniques. Systems described include catalytically active monolayers on electrode surfaces, oxygen or hydroxide adlattices on Cu, enhanced and additive-modified deposition of Cu, and molecular adsorbates on Au and Ag electrodes. 

Ellipsometry was used hy Giannoulis et al. [9] to study fihn thicknesses of therapeutic sOicon-based microdevices under development. In situ characterization of the growth of electroactive films of oxides and hydroxides of transition metals has been done with scanning tunneling microscopy (STM), atomic force microscopy (AFM), and intermittent contact atomic force microscopy (ICAFM). Shrinkage and enhanced thicknesses of films can be measured with these methods. Films of iridium oxide, nickel oxides, and polyaniline were studied here. 

---