Atomic force microscopy vibration scanning mode

Ceo = Fullerene SWNTs = Single-walled carbon nanotubes MWNTs = Multiwalled carbon nanotubes DWNTs = Double-walled carbon nanotubes CNTs = carbon nanotubes TEM = Transmission electron microscopy HRTEM = High-resolution transmission electron microscopy SEM = Scanning electron microscopy AFM = Atomic force microscopy Ch = Chiral vector CVD = Chemical vapor deposition HiPco process = High-pressure disproportionation of CO RBM = Radical breathing vibration modes DOS = Electronic density of states. 

In the so-called piezo-mode of atomic force microscopy an ac voltage is applied to a conductive AFM cantilever while scanning the surface of a piezoelectric material. The tip of the cantilever senses the local deformation of the surface caused by the electric field between the tip and a counter electrode (Fig. 5b, see also Fig. 10). Usually the ac frequency is far below the free resonance frequency of the AFM cantilever [16,17,19,20]. In BaTiOs, an image series based on vertical and torsional cantilever vibration signals of the same surface area allowed the reconstruction of the domain orientation using this mode [20]. 

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