Scanning Kelvin Probe Force Microscopy SKPFM

4 Scanning Kelvin Probe Force Microscopy (SKPFM) 

Instrumentation. The experimental procedure for an AFM equipped with a suitably coated tip has been outlined above. In a study of an aluminum alloy AA2024-T3, intermetallic particles and the matrix phase could be separated clearly [98]. The different surface films on these phases could be associated with their corrosion behavior. Inclusions and their corrosive behavior have been studied with a combination of SKPFM and AFM [101]. The effect of chloride-containing solution on corrosion at the matrix and the intermetallic particles was studied with SKPFM, in addition, light scratching with the AFM in the contact mode was applied to study the effect of the mechanical destabilization [102]. The intermetallic particles dissolved immediately after the film on their surface had been destabilized by mechanical abrasion. 

Filiform corrosion on epoxy-coated 1045 carbon steel was investigated with SKPFM [111]. Under coatings of 150 and 300 nm thickness at 93% relative humidity, samples were studied under air. Separation of active anode and cathode locations in the head of the filament could be identified. Microscopic and even submicroscopic aspects of electrochemical delamination have been studied with SKPFM [99]. 

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Defects at the interface most likely play an important role in the delamination process. Unfortunately, the defects in self-assembled films are mostly nanoscopic and can be studied only with atomic force microscopy (AFM) and STM, which require very time-consuming preparation and limit the flexibility of the experiments. Other operation modes such as scanning Kelvin probe force microscopy (SKPFM) [73] will play an important role in future work [74]. 

SKPFM Scanning Kelvin probe force microscopy... 

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