Secondary Electron Image Resolution

Spatial Resolution of Images and Elemental Analyses 7.4.2.1 Secondary Electron Image Resolution... 

Field emission scanning electron microscopy (FESEM) analysis was performed with a HITACHI S-4800 instrument in a cryo-mode with secondary electron image resolution of 1.0-1.4 nm at voltages of 1-15 kV. For all measurements, aqueous solutions of nanogels with a concentration of 5 mg/mL were rapidly vitrified in liquid propane and transferred to the high vacuum Balzers BF freeze-etching chamber. Fracture surfaces were prepared by means of a lever and etched by sublimation of the vitrified water for 5-15 min. 

Figure 7.4 High-resolution secondary electron image of an a-Al203 support (from Liu et al. [It]).

The spatial resolution of scanning Auger microprobe systems Is now equivalent to most scanning electron microscopes. High magnification secondary electron Images or absorbed current images are a routine part of the data from such systems. Quantitative Aspects of AES... 

SEM produces detailed topographical images. The image is obtained by recording the scattered secondary electrons. The resolution is typically... 

At lower gas pressures, most VPSEM use a passive scintillator as the imaging detector. This is an efficient detector of backscattered electrons in the energy range used, and there are typically more backscattered than secondary electrons. Most VPSEM/ESEM images are taken at low magnification where the secondary electron resolution is that of the SE2, that is, the same as for the backscattered electrons. The secondary electron image will therefore be very similar to the backscattered electron image. 

Figure 6.23. X-ray photoelectron spectroscopy microprobe images of contamination on a polyester sheet. (A) A secondary electron image 20/xm x-ray beams on the indicated area gave (B) the survey electron spectrum and (E) the high resolution carbon spectra. These show the presence of fluorine in the contaminant and by the presence of CF2 that it is a fluorocarbon. The maps of (D) carbon and (C) fluorine confirm this and also show that the other smaller contaminants seen in the secondary electron image are not of the same material. (See color insert.) (From PHI [367] reproduced with permission.)...

Fig. 12.3 Image of secondary electrons (high-resolution SEM, FEI Quanta 400) of fissures on the CojOVAlzOa/cordierite catalyst (NUCAT/PEQ/COPPEAJFRJ) [13],...

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