X-ray emission spectroscopy application

See also High Energy Ion Beam Analysis NMR Microscopy X-Ray Emission Spectroscopy, Applications X-Ray Emission Spectroscopy, Methods. 

Emission, Methods and Instrumentation Atomic Fluorescence, Methods and Instrumentation Fluorescence and Emission Spectroscopy, Theory Geology and Mineralogy, Applications of Atomic Spectroscopy Inductively Coupled Plasma Mass Spectrometry, Methods Proton Microprobe (Method and Background) X-Ray Emission Spectroscopy, Applications X-Ray Emission Spectroscopy, Methods X-Ray Fluorescence Spectrometers X-Ray Spectroscopy, Theory. 

In the following, we will discuss a number of different adsorption systems that have been studied in particular using X-ray emission spectroscopy and valence band photoelectron spectroscopy coupled with DFT calculations. The systems are presented with a goal to obtain an overview of different interactions of adsorbates on surfaces. The main focus will be on bonding to transition metal surfaces, which is of relevance in many different applications in catalysis and electrochemistry. We have classified the interactions into five different groups with decreasing adsorption bond strength (1) radical chemisorption with a broken electron pair that is directly accessible for bond formation (2) interactions with unsaturated it electrons in diatomic molecules (3) interactions with unsaturated it electrons in hydrocarbons ... 

During the meeting, various applications of and perspectives on the DV-Xa method were discussed in detail. Among them, the usefulness of theoretical analysis using DV-Xa calculation for X-ray and electron spectroscopy such as XPS, XES (X-ray emission spectroscopy), XANES, ELNES, and AES was presented and discussed. A new universal computational method for the many-electron-state, DV-ME (DV-multielectron) method was introduced by demonstrating its advantages and possibilities for application to the calculation of the multiplet structure of the d-d transition in various transition metal oxides. Another topic was the application of the DV-Xa method to materials science. The study of... 

Among the related methods, specific experimental designs for applications are emphasized. As in-system synchrotron radiation photoelectron spectroscopy (SRPES) will be applied below for chemical analysis of electrochemically conditioned surfaces, this method will be presented first, followed by high-resolution electron energy loss spectroscopy (HREELS), photoelectron emission microscopy (PEEM), and X-ray emission spectroscopy (XES). The latter three methods are rather briefly presented due to the more singular results, discussed in Sections 2.4-2.6, that have been obtained with them. Although ultraviolet photoelectron spectroscopy (UPS) is an important method to determine band bendings and surface dipoles of semiconductors, the reader is referred to a rather recent article where all basic features of the method have been elaborated for the analysis of semiconductors [150]. 

A brief final comment should be added concerning X-ray emission spectroscopy. The physical basis of X-ray emission is more complex than the absorption one, but in the context of catalysis, its application is mainly restricted to the obtention of high resolution XANES spectra, not limited by the core-hole broadening effect of the electron excited. This implies the measurement with high energy resolution (using secondary monochromators) of specific radiative decay paths. As an example of use within the field of catalysis, we mention that this approach has been used to attempt to distinguish CO absorption site (e.g. on-top, bride, or three-fold) on nanosized Pt clusters supported on alumina, methane partial oxidation with Pd catalysts, or CO oxidation with Pt. ... 

Johansson SAE, Campbell JL, and Malmqvist KG (1995) In Winefordner JB (ed.) Particle Induced X-Ray Emission Spectroscopy (PIXE), vol. 133 of Chemical Analysis A Series of Monographs on Analytical Chemistry and its Applications. Chichester Wiley. 

Johansson SAE (ed) (1977) Nucl Instr Meth 142 1-338 Johansson SAE (ed) (1981) Nucl Instr Meth 181 1-537 Johansson SAE, Campbell JL (1988) PIXE a novel technique for elemental analysis. Wiley, Chichester Johansson SAE, Campbell JL, Malmqvist KG (1995) Particle induced X-ray emission spectroscopy (PIXE). In Winefordner JD (ed) Chemical analysis a series of monographs on analytical chemistry and its applications, vol 133. WUey, New York Johansson SAE, Johansson TB (1976) Nucl Instrum Methods 137 473-516... 

Compared to X-ray absorption only minor efforts went into the application of X-ray emission spectroscopy to solid state or chemical problems in the lanthanides. This might be due to the fact that usually X-ray emission lines are superimposed on a set of weakly resolved and often undefined satellite lines. Accordingly chemical shifts from X-ray emission can be unambiguously related to the chemical oxidation state in only a few cases. Most of the few X-ray emission experiments dedicated to the exploration of the electronic configurations and of the chemistry of the lanthanides, analyze inner shell transitions, i.e., radiative transitions from levels inside the Xe core. Lee et al. (1974) used the shifts of the K , 2(Ln,ni K) K)... 

See atso X-Ray Emission Spectroscopy, Methods X-Ray Fluorescence Spectrometers X-Ray Fluorescence Spectroscopy, Applications. 

See also Atomic Absorption, Methods and instrumentation Atomic Absorption, Theory Atomic Emission, Methods and instrumentation Fiuorescence and Emission Spectroscopy, Theory Food and Dairy Products, Appiications of Atomic Spectroscopy Forensic Science, Appiications of Atomic Spectroscopy inductiveiy Coupied Plasma Mass Spectrometry, Methods Pharmaceutical Applications of Atomic Spectroscopy X-ray Fluorescence Spectrometers X-ray Fluorescence Spectroscopy, Applications. 

Ion beam probes are used in a wide range of techniques, including Secondary Ion Mass Spectroscopy (SIMS), Rutherford backscattering spectroscopy (RBS) and proton-induced X-ray emission (PIXE). The applications of these and number of other uses of ion beam probes are discussed. 

Summary. X-ray line emissions from ultrashort high-intensity laser-produced plasma were studied in order to clarify the physics of energy transport associated with the generation of ultrashort X-ray pulses for use in various applications. This article reviews two topics. The first is the application of Ka spectroscopy to the study of energy transport in laser-produced plasma. The second topic is the application of X-ray polarization spectroscopy to measurements of the anisotropy of hot electrons generated with ultrashort high-intensity laser pulses. 

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