Scanning Auger microprobe analysis

Two-phase particles ranging from 10 to 20 microns in size, supported on a graphite substrate, were observed in-situ in the UHV chamber of a scanning Auger microprobe. Both surface composition analysis and imaging of the particles could be undertaken. The preparation of the samples has been described in detail elsewhere. ... [Pg.56]

Some instruments, called scanning Auger microprobes (SAM) offer two-dimensional scan control (rastering) of the electron beam, so that analysis can be carried out as a function of surface position. The spatial resolution is controlled by the beam diameter, which can be as small as 50 nm. [Pg.716]

Although this technique is not normally used for thin polymer films for the reasons described before, it can be used for analyzing the surface of polymer composites containing conductive fillers, e.g. carbon fibers. In addition, because of the surface specificity, the sampled area can be maintained almost identically to the beam cross-section so that the scanning Auger microscope (SAM) can have a spatial resolution that is much better than that of microprobe analysis. [Pg.29]

Characterization thus involves analytical electron microscopy, ordinary microprobe analysis or other techniques for localizing elements or chemical compounds (Scanning Auger Spectroscopy, Raman Microprobe, Laser Microprobe Mass Spectrometry). It also requires, in most cases, some physical separation of the catalyst for separate analysis (e.g., near surface parts and center of pellets, by peeling or progressive abrasion pellets present at various heights in the catalyst bed, etc.). [Pg.570]

Surface analytical methods — Important ex situ methods for surface analysis are X-Ray Photoelectron Spectroscopy (XPS) UV-Photoelectron Spectroscopy (UPS), Auger Electron Spectroscopy (AES), Ion Scattering Spectroscopy (ISS), Rutherford Backscattering (RBS), Secondary Ion Mass Spectroscopy (SIMS), Scanning Electron Microscopy (SEM), Electron Microprobe Analysis (EMA), Low Energy Electron Diffraction (LEED), and High Energy Electron Diffraction (RHEED). [Pg.650]

Scanning electron microsopy (SEM) and electron microprobe analysis (EMA) — A scanning focused electron beam causes the ionization of core levels similar to scanning AES. An alternative and thus a competing process to the ejection of Auger electrons is the emission of X-ray fluorescence radiation. These X-rays... [Pg.651]

Three types of instrumentation exist for dynamic SIMS non-imaging ion probes, direct-imaging ion microanalysers and scanning ion microprobes-micro-scopes. Non-imaging ion probes are often an accessory of Auger electron spectroscopy (AES), electron spectroscopy for chemical applications (ESCA), or electron microscopy systems and allow a point analysis. Imaging equipment allows a point-to-point analysis of the surface with a primary beam of size 10—300 pm (microanalysers) or below 10 pm (microprobes-microscopes). [Pg.572]

Auger Electron Spectroscopy Electron Microprobe Analysis of Minerals Imaging Optics Particle Size Analysis Positron Microscopy Scanning Electron Microscopy... [Pg.158]

Ion beam spectrochemical analysis Auger emission spectroscopy Scanning electron microscopy (SEM) Electron microprobe (EMPA) Particle-induced X-ray emission spectroscopy (PIXE)... [Pg.154]

It is also common for pol3rmeric compoimds to form surface regions with compositions different from the bulk material, by selective diffusion of components. This process is termed blooming when the surface component is solid, and bleeding if it is liquid. Sulfur and fatty acid blooms can inhibit adhesion in rubber laminates (3). Laser desorption mass spectroscopy has been employed to identify surface species on vulcanized rubber (4). X-ray scattering methods for the study of polymer surfaces and interfaces have been reviewed (5). Other surface analysis techniques commonly used with polymers include attenuated total reflectance (6-8), electron microprobe (9), Auger electron spectroscopy (10), x-ray photoelectron spectroscopy (11), and scanning probe microscopic methods (12). Overviews on polymer surface analysis have been published (13,14). [Pg.312]

The research activities in the field of electrochemical materials science included electrochemical studies of metals and alloys, which were conducted, employing such methods as cychc voltammetry, electrochemical impedance spectroscopy, quartz crystal nanogravimetry, etc. These investigations in all cases were supported by the characterization of crystalline structure and chemical and phase composition of deposited layers, by means of transmission electron microscopy (TEM), electron diffi action, scanning electron microscopy with microprobe (EDX) analysis. X-ray and Auger electron spectroscopies (XPS), and X-ray diffraction (XRD) techniques. The latter studies were conducted in collaboration with the colleagues from the ICh department of materials strucmre characterization (R. Juskenas, A. Selskis, and V. Jasulaitiene). [Pg.199]