Radiation fluorescence

Flere C is the volume concentration of j-phase particles is the mass concentration of the analyte in the j-phase particles w is the x-ray fluorescence radiation yield t. is the mass absorption coefficient of the analyte for the primar y radiation d. is the j-phase particle effective size r fs... 

The analysis was performed by XRF method with SR. SRXRF is an instrumental, multielemental, non-destructive analytical method using synchrotron radiation as primary excitation source. The fluorescence radiation was measured on the XRF beam-line of VEPP-3 (E=2 GeV, 1=100 mA), Institute of Nuclear Physics, Novosibirsk, Russia. For quality control were used international reference standards. 

In X-Ray Fluorescence (XRF), an X-ray beam is used to irradiate a specimen, and the emitted fluorescent X rays are analyzed with a crystal spectrometer and scintillation or proportional counter. The fluorescent radiation normally is diffracted by a crystal at different angles to separate the X-ray wavelengths and therefore to identify the elements concentrations are determined from the peak intensities. For thin films XRF intensity-composition-thickness equations derived from first principles are used for the precision determination of composition and thickness. This can be done also for each individual layer of multiple-layer films. 

In Total Reflection X-Ray Fluorescence Analysis (TXRF), the sutface of a solid specimen is exposed to an X-ray beam in grazing geometry. The angle of incidence is kept below the critical angle for total reflection, which is determined by the electron density in the specimen surface layer, and is on the order of mrad. With total reflection, only a few nm of the surface layer are penetrated by the X rays, and the surface is excited to emit characteristic X-ray fluorescence radiation. The energy spectrum recorded by the detector contains quantitative information about the elemental composition and, especially, the trace impurity content of the surface, e.g., semiconductor wafers. TXRF requires a specular surface of the specimen with regard to the primary X-ray light. 

Fig. 4.15. Angular dependence of the fluorescence radiation emitted from a Co-layered Si substrate. The Co-Ka intensity is plotted semi-logarithmically for layers of different thickness (mm). The maxima forthe ultra-thin Co-layers are located at the critical angle of Si (dashed vertical line). They are shifted to the critical angle of Co (dotted vertical line) ifthe layer is more than 10 mm thick ([4.21], after Ref [4.41]).

Reactions Producing Fluorescent Radiation In the reaction chamber of the ultraviolet fluorescent analyzer reactions producing fluorescence are... 

In the preceding formula, denotes the intensity absorbed from the excitation radiation (intensity /g). This absorbed intensity generates fluorescent radiation and other reactions. 

Since only relatively few substances are capable of emitting fluorescent radiation, they can be particularly selectively detected. This means that the selectivity of the chromatographic separation, which is always aimed at, is meaningfully extended by the selectivity of detection. Accompanying substances that absorb radiation but do not emit light do not interfere when the analysis is made by the selective determination of fluorescence ... 

Intermediate methods include the earliest procedure based on Stein s equation [33] and one based on Samuels equation [34]. Among the direct methods is an IR spectroscopic method based on the measurement of the dichroic ratio (R), of amorphous absorption bands. In the investigations [35], the amorphous bands 898 cm" and 1368 cm", for which the angles of transition moment are a898 = 39 and aneg = 80 , respectively, were used. Other methods are spectroscopy of polarized fluorescent radiation [35,36], measurement of color di-... 

In AFS, the analyte is introduced into an atomiser (flame, plasma, glow discharge, furnace) and excited by monochromatic radiation emitted by a primary source. The latter can be a continuous source (xenon lamp) or a line source (HCL, EDL, or tuned laser). Subsequently, the fluorescence radiation is measured. In the past, AFS has been used for elemental analysis. It has better sensitivity than many atomic absorption techniques, and offers a substantially longer linear range. However, despite these advantages, it has not gained the widespread usage of atomic absorption or emission techniques. The problem in AFS has been to obtain a... 

Both WDXRF and EDXRF lend themselves admirably to quantitative analysis, since there is a relationship between the wavelength or energy of a characteristic X-ray photon and the atomic number of the element from which the characteristic emission line occurs. The fluorescence intensity of a given element is proportional to the weight fraction. Emitted fluorescence radiation is partly absorbed by the matrix, depending on the total mass absorption coefficient ... 

In order to apply fluorescence corrections it is necessary to calculate the intensity of the fluorescence radiation of element A (7f) excited by the characteristic radiation of element B, and to obtain the ratio /f//A, where IA is the intensity of A radiation produced directly by electron bombardment. The fluorescence factor F is given by Ff=l/[l+(/f//A)]. 

X-ray fluorescence analysis is a nondestructive method to analyze rubber materials qualitatively and quantitatively. It is used for the identification as well as for the determination of the concentration of all elements from fluorine through the remainder of the periodic table in their various combinations. X-rays of high intensity irradiate the solid, powder, or liquid specimen. Hence, the elements in the specimen emit X-ray fluorescence radiation of wavelengths characteristic to each element. By reflection from an analyzing crystal, this radiation is dispersed into characteristic spectral lines. The position and intensity of these lines are measured. 

Radiation from a xenon or deuterium source is focussed on the flow cell. An interchangeable filter allows different excitation wavelengths to be used. The fluorescent radiation is emitted by the sample in all directions, but is usually measured at 90° to the incident beam. In some types, to increase sensitivity, the fluorescent radiation is reflected and focussed by a parabolic mirror. The second filter isolates a suitable wavelength from the fluorescence spectrum and prevents any scattered light from the source from reaching the photomultiplier detector. The 90° optics allow monitoring of the incident beam as well, so that dual uv absorption and fluorescence... 

The 02, radical can act as an oxidant as well as a reductant and chemical estimates of its production can also be based on its ability to oxidize epinephrine to adren-ochrome [62], These chemical methods have the additional advantage of not requiring highly specialized equipments. Also based on its redox property, the 02 radical can be determined by chemiluminescence methods through the measurement of the intensity of the fluorescence radiation emitted after chemical oxidation of 02 by, e.g., lucigenin [63-67], These methods, however, are limited by the poor selectivity and lack of capability for in-vivo performance. 

Characteristic fluorescent radiation emitted from an atomic vapour of the analyte following irradiation with UV/visible primary radiation of broad spectrum. 

The relation between the intensities of the incident radiation I0 and the fluorescent radiation IF is complex, i.e. 

Within its orbit, which has some of the characteristics of a molecular orbital because it is shared with electrons on the surrounding atoms, the electron has two possible spin multiplicity states. These have different energies, and because of the spin-multiplicity rule, when an (N-V) center emits a photon, the transition is allowed from one of these and forbidden from the other. Moreover, the electron can be flipped from one state to another by using low-energy radio-frequency irradiation. Irradiation with an appropriate laser wavelength will excite the electron and as it returns to the ground state will emit fluorescent radiation. The intensity of the emitted photon beam will depend upon the spin state, which can be changed at will by radio-frequency input. These color centers are under active exploration for use as components for the realization of quantum computers. 

Quantitative concentration data are often required from XRF analyses. In principle (for both WD and ED) the intensity of the fluorescent X-ray peak is proportional to the amount of the element present. This is complicated, however, by absorption and enhancement processes. Absorption can cause both attenuation of the input (primary) radiation and the fluorescent (secondary) radiation, as discussed above. Enhancement is the result of the observed element absorbing secondary radiation from other elements present in the sample, thus giving more fluorescent radiation than would otherwise... 

Radiation from a Xenon-radiation or a Deuterium-source is focussed on the flow cell through a filter. The fluorescent radiation emitted by the sample is usually measured at 90° to the incident beam. The second filter picks up a suitable wavelength and avoids all scattered light to reach ultimately the photomultiplier detector. 

---