Microprobe analysis

Edx is based on the emission of x-rays with energies characteristic of the atom from which they originate in Heu of secondary electron emission. Thus, this technique can be used to provide elemental information about the sample. In the sem, this process is stimulated by the incident primary beam of electrons. As will be discussed below, this process is also the basis of essentially the same technique but performed in an electron spectrometer. When carried out this way, the technique is known as electron microprobe analysis (ema). 

Electron Microprobe A.na.Iysis, Electron microprobe analysis (ema) is a technique based on x-ray fluorescence from atoms in the near-surface region of a material stimulated by a focused beam of high energy electrons (7—9,30). Essentially, this method is based on electron-induced x-ray emission as opposed to x-ray-induced x-ray emission, which forms the basis of conventional x-ray fluorescence (xrf) spectroscopy (31). The microprobe form of this x-ray fluorescence spectroscopy was first developed by Castaing in 1951 (32), and today is a mature technique. Primary beam electrons with energies of 10—30 keV are used and sample the material to a depth on the order of 1 pm. X-rays from all elements with the exception of H, He, and Li can be detected. 

S. J. B. Reed in Electron Microprobe Analysis, Cambridge University Press, London, 1975. 

J Electron microprobe analysis. The instrument which I shall introduce here is, in my view, the most important development in characterisation since the 1939-1945 War. It has completely transformed the study of microstructure in its compositional perspective. 

Duncumb, P. (2000) Proceedings of Symposium Fifty Years of Electron Microprobe Analysis . August 1999, Microscopy and Microanalysis. 

Soluble pigments The most important pigments in this class are the metallic chromates, which range in solubilities from 17 0 to 0-00005 g/1 CrO . An examination has recently been carried out of the mechanism of inhibition by chromate ions and it has been shown by chemical analysis of the stripped film, Mdssbauer spectroscopy and electron microprobe analysis that the air-formed film is reinforced with a more protective material in the form of a chromium-containing spinel (Chapter 17). The situation is, however, complicated by the possibility that some chromates, particularly the basic ones, may inhibit through the formation of soaps. There is evidence that lead chromate can function in this way. 

Neutron Activation Analysis X-Ray Fluorescence Particle-Induced X-Ray Emission Particle-Induced Nuclear Reaction Analysis Rutherford Backscattering Spectrometry Spark Source Mass Spectrometry Glow Discharge Mass Spectrometry Electron Microprobe Analysis Laser Microprobe Analysis Secondary Ion Mass Analysis Micro-PIXE... 

Microprobe analysis was initially developed at the University of Paris by R. Castaing, who fitted an X-ray spectrometer to a converted electron microscope in the early 1950s, and the first commercial instrument, developed in France by the Cameca company, appeared in 1958. The following years saw commercial instruments produced in the UK, USA and Japan. 

Reed, S.J.B. (1993) Electron Microprobe Analysis (Second Edition) Cambridge University... 

The exponentially decrease of the total variance with increasing sample mass is shown in Fig. 2.7. It can be seen that the uncertainty of sampling, s2samp, decreases and becomes statistically insignificant when the sample amount m exceeds the critical sample mass. Instead of mcnt the proportional critical sample volume vcrit may also be considered, represented, e.g. by a critical microprobe diameter dcnt. Results of homogeneity investigations of alloys, ores, and lamellar eutectics by EPMA (Electron Microprobe Analysis), which correspond to the curve of Fig. 2.7, have been presented by Danzer and Kuchler [1977]. 

Fig. 3.11. Temporally ( ) or spatially (/) dependent analytical measurements, e.g., a line scan of electron microprobe analysis represented in a three-dimensional (a) and quasi-three-dimensional way (b)... 

Ferguson IF (1989) Auger microprobe analysis. Hilger, Bristol... 

Aircraft turbines in jet engines are usually fabricated from nickel-based alloys, and these are subject to combustion products containing compounds of sulphur, such as S02, and oxides of vanadium. Early studies of the corrosion of pure nickel by a 1 1 mixture of S02 and 02 showed that the rate of attack increased substantially between 922 K and 961 K. The nickel-sulphur phase diagram shows that a eutectic is formed at 910 K, and hence a liquid phase could play a significant role in the process. Microscopic observation of corroded samples showed islands of a separate phase in the nickel oxide formed by oxidation, which were concentrated near the nickel/oxide interface. The islands were shown by electron microprobe analysis to contain between 30 and 40 atom per cent of sulphur, hence suggesting the composition Ni3S2 when the composition of the corroding gas was varied between S02 02 equal to 12 1 to 1 9. The rate of corrosion decreased at temperatures above 922 K. 

Acknowledgements We are grateful to Fortune Minerals for logistical support at NICO, K. Venance (GSC) for microprobe analysis, the DIVEX research network for supporting the iron... 

Polished thin sections were made in the absence of water to prevent dissolution of soluble phases. Mineral composition was determined using a combination of X-ray diffraction, electron microprobe analysis, and scanning electron microscopy with... 

Stoichiometric variations in compositions of a material and of surface layers can be revealed by AEM. Because a relatively small amount of scattering occurs through a thin HRTEM specimen, X-rays are generated from a volume that is considerably less than in the case of electron microprobe analysis (EPMA). For quantitative microanalysis, a ratio method for thin crystals (57) is used, given by the equation ... 

Malmqvist KG. Proton microprobe analysis in biology. Scanning Electron Microsc 1986 IB 821-845. 

As indicated in Fig. 7.2, X-rays are among the by-products in an electron microscope. Already at the beginning of this century, people knew that matter emits X-rays when it is bombarded with electrons. The explanation of the phenomenon came with the development of quantum mechanics. Nowadays, it is the basis for determining composition on the submicron scale and, with still increasing spatial resolution, is used in the technique referred to as Electron Microprobe Analysis (EMA), Electron Probe Microanalysis (EPMA) or Energy Dispersive Analysis of X-rays (EDAX, EDX) [21]. 

The interaction of an electron with an atom gives rise to two types of X-rays characteristic emission lines and bremsstrahlung. The atom emits element-characteristic X-rays when the incident electron ejects a bound electron from an atomic orbital. The core-ionized atom is highly unstable and has two possibilities for decay X-ray fluorescence and Auger decay. The first is the basis for electron microprobe analysis, and the second is the basis of Auger electron spectroscopy, discussed in Chapter 3. 

Electron interference devices, 22 169 Electron ionization source, 15 652-653 Electron lenses, 24 78 Electron microprobe analysis (EMA), 24 78, 109... 

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