Interfaces characterization

Abruiia H D 1991 Electrochemical Interfaces Modern Techniques for In Situ Interface Characterization (New York VCH) Comprehensive introduction into in situ teclmiques for the investigation of the electrochemical interface. 

Knoll W (1991) Polymer thin films and interfaces characterized with evanescent light. Makromol Chem 192 2827-2856... 

Spectroscopic ellipsometry is a non-destructive, interface sensitive, in situ technique for interface characterization. Time resolved ellipsometric spectroscopy was used to determine the mechanism of electrochemical deposition of photoresists on copper electrodes under potentiostatic, anodic conditions. Nucleation of photoresist deposition occurs randomly. During the early stages of nucleation the semi-spherical particles are separated by about 100 A. The deposits tend to grow like "pillars" up to 50 A. Further growth of the "pillars" lead to coalescence of the photopolymer deposits. 

D. A. Buttry, in Electrochemical Interfaces. Modem Techniques for in-situ Interface Characterization, Ed. by HD. Abruna, VCH Publishers, New York, 1991. 

P. Zelenay and A. Wieckowski, in Electrochemical Interfaces, Modern Techniques for in situ Interface Characterization, Ed. by H. D. Abruna, VCH Publishers, New York, 1991. A. Wieckowski, M. Szklarczyk, and 1. Sobkowski, I. Electroanal. Chem. 113 (1980) 79. A. Wieckowski, 1. Sobkowski, P. Zelenay, and K. Eranaszczuk, Electrochim. Acta 26... 

H. D. Abruna (ed.), Electrochemical Interfaces - Modem Techniques for In-Situ Interface Characterization (VCH Publishers, Inc., New York, 1991). 

Duplicate and triplicate IFT aging curves were obtained at one or two temperatures for most of the interfaces characterized in this study. The replicate IFT data reported in Figures 1,3,4,7,8 and 10-14 show that many IFT aging curves for citrus oil/aqueous phase interfaces differ by a maximum of 1.7mJ/m2. Replicate curves often differ by less than lmJ/m2. Because each IFT aging experiment involved formation and separation of a new complex coacervate and supernatant phase, replicate IFT aging curves measure the combined effect that several factors have on reproducibility. These factors include variability of the complex coacervation procedure, protocol followed for separation of the coacervate and supernatant phases, and the IFT measurement process itself. The variability in solids content of replicate coacervate and supernatant phases shown in Table 1 could contribute to the observed IFT variability. 

W. Moritz, I. Gerhardt, D. Roden, M. Xu and S. Krause, Photocurrent measurements for laterally resolved interface characterization, Frese-nius J. Anal. Chem., 367(4) (2000) 329-333. 

Table 1 of a paper by Murr (2) lists problems and/or concerns related to specific interface materials and specific components of SECS. In Table 2 of the same work, he related topical study areas and/or research problems to S/S, S/L, S/G, L/L, and L/G interfaces. It is also useful to divide interface science into specific topical areas of study and consider how these will apply to interfaces in solar materials. These study areas are thin films grain, phase, and interfacial boundaries oxidation and corrosion adhesion semiconductors surface processes, chemisorption, and catalysis abrasion and erosion photon-assisted surface reactions and photoelectrochemistry and interface characterization methods. The actual or potential solar applications, research issues and/or concerns, and needs and opportunities are presented in the proceedings of a recent Workshop (4) and summarized in a recent review (3). 

Recent developments in surface-characterization methods have been made possible to a great extent by technological advances in areas such as lasers, ultra-high vacuum, charged-particle optics, and computer science. The surface-analysis techniques are commonly used to probe the interface between two phases after one phase is removed, but there is now a growing demand for additional methods for in situ interface characterization. 

The fluid phase that fills the voids between particles can be multiphase, such as oil-and-water or water-and-air. Molecules at the interface between the two fluids experience asymmetric time-average van der Waals forces. This results in a curved interface that tends to decrease in surface area of the interface. The pressure difference between the two fluids A/j = v, — 11,2 depends on the curvature of the interface characterized by radii r and r-2, and the surface tension, If (Table 2). In fluid-air interfaces, the vapor pressure is affected by the curvature of the air-water interface as expressed in Kelvin s equation. Curvature affects solubility in liquid-liquid interfaces. Unique force equilibrium conditions also develop near the tripartite point where the interface between the two fluids approaches the solid surface of a particle. The resulting contact angle 0 captures this interaction. 

Figure 2.38 Interfacial solvation (a) a solvated molecule embedded in a cavity lying on top of a metal surface (b) a solvated molecule at the diffuse interface characterized by position-dependent properties, e.g. permittivity e(z).

For curved interfaces, characterized by the principal curvatures ci and C2, the Gibbs phenomenological theory leads to the following expression for df0 (refs. 17-19) ... 

Metal—Polyimide Interfaces Characterized by Secondary Ion Mass Spectroscopy... 

Rothenhausler, B., and Knoll, W. Surface-plasmon Microscopy. Nature 322, 615 (1988). Knoll, W. Polymer Thin Films and Interfaces Characterized with Evanescent Light. Makromol. Chem. 192, 2827 (1991). 

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