IEEE-488 standard

Device measurement can be performed after the device is held at a fixed bias for some time this will expose the direction and nature of the hysteresis. The IEEE 1620 standard recommends 10 minutes at Vos = Vds = OH. Holding the device at a high bias before measurement can also be used to measure the complementary effect. 

The selection of tests used to characterize a device needs to be motivated by the end application of the transistors in question. There are, however, some general guidelines which can guide the structure of test programs. This section makes some recommendations and also includes information on the recommendations of the IEEE 1620 standard. 

IEEE Standards Coordinating Committee 28, Safety Eevels with Respect to Human Exposure to Radio Frequemy Electromagnetic Fields, 3 to 300 GH ... 

ANSI/IEEE C95.1-1992, IEEE Standards Dept., Piscataway, N.J., 1992. 

IEEE 4/1995 Relevant US standards ANSI/NEMA and IEEE Standard techniques for HV testing ... 

Myrtle Beach, 1979, Conference Record of the 1979 IEEE Standards Workshop on Human f-actors and Nuclear Safety, IEEE Cat. No. TH0075-2, December. 

For offshore locations where ignitible gas-air concentrations are neither continuously present nor present for long periods, API RP 14F also allows type MC cable with a continuous aluminum sheath and an outer impervious jacket (such as PVC) and armored cables satisfying ANSI/ Institute of Electrical and Electronic Engineers (IEEE) Standard No. 45. API RP 14F does not recommend IMC for offshore installations and cautions users that installations of MI cable require special precautions. The insulation of MI cable is hygroscopic (able to absorb moisture from the atmosphere). 

Figure 2.1 Active equipment failure modes. Reprinted from ANSI IEEE Std. 500-1984, with permission of the IEEE Standards Department.

Guide to the Collection and Representation of Electronic, Sensing Component, and Mechanical Equipment Reliability Data for Nuclear Generating Stations. IEEE Standard 500-1984, Institute of Electrical and Electronics Engineers, New York, 1984. 

The NEMA standard specifies that the procedure is to be the latest revision of the Institute of Electrical and Electronics Engineers (IEEE) Standard 841-1994. It is much more rigorous and uniform than the International (lEC 34-2), British (BS-269), and Japanese (JEC-37) methods, based on the U.S. evaluation of all the methods. 

Many of the major motor manufacturers discovered on comparison of their own specifications to the IEEE Standard 841-1994 that their designs already exceeded the requirements of the new standard. Others made a few modifications, and their units satisfied the new standard. The standard required, among other items, (a) a no-load vibration limit of 0.08 in./sec and (b) a temperature rise of 80°C maximum with Class B insulation at rated load. The life of the motor is essentially controlled by the life of its internal insulation and is represented by Figure 14-11. ... 

A. All motor drives for use in process plant applications should meet the requirements of the Electrical and Electronics Engineers (IEEE) Standard 841-1994 (or latest edition), The National Electrical Manufacturers Association Standard MG-1 (latest edition) and the National Eire Protection Association applicable Standards/Codes (latest edition). 

IEEE see 21 IEEE Standards coordinating committee - fuel cells, photo-voltaics, dispersed generation and energy storage... 

IEEE sec 36 IEEE Standards Coordinating Committee - pertains to utility communications... 

IEEE Standard 634. TestingofFire Flated Penetration Seals. Institute of Electrical and Electronic Engineers. 

IEEE. Standard Glossary of Software Engineering Terminology. IEEE Std 610.12-1990. IEEE, Sep. 28,1990. 

Piezoelectric coefficients need to be measured accurately over a wide range of temperature, drive field amplitude, and frequency, in order to predict device performance appropriately. There are multiple methods available for such characterization in bulk materials and thin films. This paper overviews some of the standard characterization tools, with an emphasis on the methods utilized in the ieee Standard on Piezoelectricity. In addition, several of the evolving methods for making accurate piezoelectric coefficient measurements on thin films are reviewed. Some of the common artifacts in piezoelectric measurements, as well as means of avoiding them, are discussed. 

An excellent reference describing appropriate ways of measuring the piezoelectric coefficients of bulk materials is the IEEE Standard for Piezoelectricity [1], In brief, the method entails choosing a sample with a geometry such that the desired resonance mode can be excited, and there is little overlap between modes. Then, the sample is electrically excited with an alternating field, and the impedance (or admittance, etc.) is measured as a function of frequency. Extrema in the electrical responses are observed near the resonance and antiresonance frequencies. As an example, consider the length extensional mode of a vibrator. Here the elastic compliance under constant field can be measured from... 

The ieee Standard on Piezoelectricity [1] describes these measurements in considerable detail, and gives the necessary sample geometries for determination of a number of the piezoelectric constants. For example, the relations that enable determination of the other common piezoelectric moduli in bulk ceramics are given in Equation (2.7). 

In other cases, the large signal dielectric loss [19] (calculated as in Figure 2.6) is reported as a measure of the energy loss per cycle. Work is currently on-going on preparation of an ieee standard in this area. 

Berry et al. [54] employed guidelines for skin exposure to THz radiation (15 GHz to 115 THz) drawn from American National Standard for the Safe Use of Lasers (ANSI Z136.1) and from the IEEE Standard for Safety Levels with Respect to Human Exposure to Radio Frequency Electromagnetic Fields (C95.1). They concluded that the maximum permissible average beam power was 3 mW, suggesting that typical THz imaging systems are safe. 

IEEE Standard Digital Interface for Programmable Instrumentation IEEE Std. 488-1975. New York IEEE 1975... 

IEEE Standard Hardware Description Language Based on the Verilog Hardware Description Language, IEEE Std 1364-1995, IEEE, 1995. 

The Verilog Hardware Description Language, often referred to as Verilog HDL, is an IEEE standard (IEEE Std 1364). The language can be used to describe the behavior, sequential and concurrent, or structure of a model. It can support the description of a design at multiple levels of ab-... 

A Verilog Synthesis Interoperability Working Group, of which I am the Chair, is at present working to develop an IEEE standard for RTL synthesis. 

IEEE Standard on Piezoelectricity 176-1987 IEEE Press Piscataway, NJ (1986). 

Individual procedures can easily consume 10 to 15 days effort to produce, even with experienced staff. Use should be made of industry guidance when developing procedures, e.g., GAMP example procedures and IEEE standards. Where existing procedures are being revised to secure validation compliance, this estimate of effort could be reduced by about half. As recommended above, this should be supplemented with about 20 days effort across all the procedures, shared among a team of end users. The individuals should contain the core users who are involved in all the procedures in order to ensure consistency. Other end users on the team, however, can be seconded for the development of particular procedures in which they have a specific interest, or can contribute a particular skill or competence. For instance, an end user quality representative may wish to be seconded for the development of the Supplier Audit procedure. 

Each requirement must be written so that it can be tested if required. According to IEEE standard 1233, a well-defined requirement must address capability, condition, and constraint. Remember, as shown in Figure 20.6, that the URS functions are related to the tests carried out in the qualification phase of the life cycle. If the requirements are not specified, how can they be tested Further discussion on CDS user requirements can be found in McDowall. ... 

A documentation standard for the PQ test plan can be found in the IEEE standard 829-1998, presented in Table 20.4. The key sections of a PQ test plan are the features to test and those that will not be tested and associated with the features to be tested are the written notes of the assumptions, exclusions, and limitations to the testing imdertaken. The assumptions, exclusions, and limitations of the testing effort were recorded in the appropriate section of the qualification test plan to provide contemporaneous notes of why particular approaches were taken. This is very useful if an inspection occurs in the future, as there is a reference back to the rationale for the testing. It is also very important as no user can fully test a CDS or any other software application. 

Outline of a Test Plan from IEEE Standard 829-1998... 

In the same IEEE standard can be foimd the basis for the test documentation that is the heart of any PQ effort, i.e., the test script. In essence this document will ... 

IEEE Standard 829-1983, Software Test Documentation, Institute of Electronic and Electrical Engineers (1983). 

ANSI (1983), IEEE Standard for Software Test Documentation, ANSI/IEEE Std. No. 829-1983, The Institute of Electrical and Electronic Engineers, New York. 

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