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Standardization IEEE standards

The kernel part of these documents consists of IEEE Software Engineering Standards. IEEE standards are written for general application purpose therefore, they tend to be very comprehensive and generic. The total number of pages of QA related standards exceeds 2,000. One can easily imagine what a huge load it will be on those people who have to prepare documents and those who have to review the documents. On the other hand, it should not be too difficult to find unnecessary conservatism for a specific case from these general-purpose documents. [Pg.70]

Each segment of the insulated wire and cable industry has its own set of standards, and cables are built to conform to specifications provided by a large variety of technical associations such as The Institute of Electrical Electronic Engineers (IEEE), The Insulated Cable Engineers Association, (ICEA), National Electrical Manufacturers Association (NEMA), Underwriters Laboratories (UL), Rural Electrification Administration of the U.S. Department of Agriculture (REA), Association of Edison Illumination Companies (AEIC), MiUtary Specifications of the Department of Defense (MIL), American Society for Testing and Materials (ASTM), National Electrical Code (NEC), etc. [Pg.322]

IEEE Standards Coordinating Committee 28, Safety Eevels with Respect to Human Exposure to Radio Frequemy Electromagnetic Fields, 3 to 300 GH ... [Pg.348]

ANSI/IEEE C95.1-1992, IEEE Standards Dept., Piscataway, N.J., 1992. [Pg.348]

Using the PC for control requires installation of a board into the expansion slot in the computer, or the PC can be connected to an external I/O module using a standard communication port on the PC (RS-232, RS-422, or IEEE-488). The controller card/module supports 16- or 32-bit microprocessors. Standardization and high volume in the PC market has produced a large selection of hardware and software tools for PC controllers. [Pg.776]

FIG. 29-23 Mollier diagram showing ASME-IEEE steam-turhine standards. To convert British thermal units per pound to kilojoules per kilogram, multiply hy 2.328 to convert British thermal units per pound-degrees Ranldne to joules per gram-Kelvin, multiply hy 4.19 and to convert poiinds-force per square inch to Idlopascals, multiply hy 6.89. [Pg.2506]

IEEE The Institute of Electrical and Electronics Engineers - USA IS Indian Standards - India... [Pg.33]

IEEE 4/1995 Relevant US standards ANSI/NEMA and IEEE Standard techniques for HV testing ... [Pg.453]

ANSI/IEEE-3.36/1991 Standard Installation, Inspection and testing requirements for power instrumentation and control equipment at nuclear facilites ... [Pg.453]

ANSI/IEEE-C62.1/1994 Standard for gapped silicon carbide surge arresters for a.c. power circuits ... [Pg.624]

IEEE 4/1995 IEEE 1313.1/1996 Standard techniques for HV testing insulation coordination. Definitions, principles and rules ... [Pg.842]

Myrtle Beach, 1979, Conference Record of the 1979 IEEE Standards Workshop on Human f-actors and Nuclear Safety, IEEE Cat. No. TH0075-2, December. [Pg.485]

For offshore locations where ignitible gas-air concentrations are neither continuously present nor present for long periods, API RP 14F also allows type MC cable with a continuous aluminum sheath and an outer impervious jacket (such as PVC) and armored cables satisfying ANSI/ Institute of Electrical and Electronic Engineers (IEEE) Standard No. 45. API RP 14F does not recommend IMC for offshore installations and cautions users that installations of MI cable require special precautions. The insulation of MI cable is hygroscopic (able to absorb moisture from the atmosphere). [Pg.532]

Figure 2.1 Active equipment failure modes. Reprinted from ANSI IEEE Std. 500-1984, with permission of the IEEE Standards Department. Figure 2.1 Active equipment failure modes. Reprinted from ANSI IEEE Std. 500-1984, with permission of the IEEE Standards Department.
Guide to the Collection and Representation of Electronic, Sensing Component, and Mechanical Equipment Reliability Data for Nuclear Generating Stations. IEEE Standard 500-1984, Institute of Electrical and Electronics Engineers, New York, 1984. [Pg.25]


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See also in sourсe #XX -- [ Pg.910 ]




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