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Secondary analyses

Mark and Rechnitz [3] systematized a vast amount of experimental material that can be used directly in KGCM. Some data are presented here that show the wide differences in organic compounds with regard to their kinetic characteristics. Table 2.1 [14] gives the relative rates of reaction of olefins with perbenzoic acid and Table 2.2 summarizes the rates of the etherification reaction of carboxylic acids with diphenyldiazomethane [15]. The tabulated data are indicative of large differences in organic compounds as far as their reactivity is concerned. The rates of reaction of some isomers differ so widely that one can, for example, analyse secondary and tertiary alkyl bromides in the presence of primary alkyl bromides in a reaction with silver nitrate [16]. It is possible to differentiate between CIS and trans isomers of 1,3-dienes by their reaction with dienophils (e.g., chloromethylene anhydride) because the cis isomer reacts much more slowly than the trans isomer [17]. [Pg.68]

DSSP computer program to analyse secondary structure and accessibilities in protein... [Pg.34]

Neutron Activation Analysis X-Ray Fluorescence Particle-Induced X-Ray Emission Particle-Induced Nuclear Reaction Analysis Rutherford Backscattering Spectrometry Spark Source Mass Spectrometry Glow Discharge Mass Spectrometry Electron Microprobe Analysis Laser Microprobe Analysis Secondary Ion Mass Analysis Micro-PIXE... [Pg.128]

Finally, Chapters 14 16 deal with innovative applications in this field such as mass spectrometric compound-specific isotopic analysis, secondary ion mass spectrometry... [Pg.515]

You can collect expert opinion and analysis in two ways by interviewing sources yourself (primary research) or by finding print or other recorded sources of expert opinion or analysis (secondary research). Sources of secondary research include the Internet, periodicals, journals, books, and transcripts. [Pg.87]

Figure 13.11—Scanning electron microscopy (SEM) accompanied by X-ray fluorescence analysis. Secondary electron image of a cross-section of a supraconducting polycrystalline ceramic with oriented grains of oxide BiPbiSriCaiCurO, (Philips instrument, model XL30FEG). Energy emission spectra corresponding to the matrix and to a 5 pm-long inclusion (bottom). It should be noted that it is possible with this technique to obtain the composition at a precise point on the sample (Link-Oxford analyser) (study by V. Rouessac, reproduced by permission of CRISMAT. University of Caen). Figure 13.11—Scanning electron microscopy (SEM) accompanied by X-ray fluorescence analysis. Secondary electron image of a cross-section of a supraconducting polycrystalline ceramic with oriented grains of oxide BiPbiSriCaiCurO, (Philips instrument, model XL30FEG). Energy emission spectra corresponding to the matrix and to a 5 pm-long inclusion (bottom). It should be noted that it is possible with this technique to obtain the composition at a precise point on the sample (Link-Oxford analyser) (study by V. Rouessac, reproduced by permission of CRISMAT. University of Caen).
Figure 11,4. ExPASy Proteomic tools. ExPASy server provides various tools for proteomic analysis which can be accessed from ExPASy Proteomic tools. These tools (locals or hyperlinks) include Protein identification and characterization, Translation from DNA sequences to protein sequences. Similarity searches, Pattern and profile searches, Post-translational modification prediction, Primary structure analysis, Secondary structure prediction, Tertiary structure inference, Transmembrane region detection, and Sequence alignment. Figure 11,4. ExPASy Proteomic tools. ExPASy server provides various tools for proteomic analysis which can be accessed from ExPASy Proteomic tools. These tools (locals or hyperlinks) include Protein identification and characterization, Translation from DNA sequences to protein sequences. Similarity searches, Pattern and profile searches, Post-translational modification prediction, Primary structure analysis, Secondary structure prediction, Tertiary structure inference, Transmembrane region detection, and Sequence alignment.
If necessary for the analysis, secondary descriptors may be included that are constructed as logical combinations of the primary descriptors. In further development of the method, it was proposed to include the so-called external physicochemical properties of a whole molecule, e.g., lipophilicity and quantum-chemical parameters important for the mechanism of action. Unfortunately, in recent years, the progress of this approach seems to have ceased. [Pg.154]

Table 1 Comparison of the Metal Impinger and Twin Impinger for the Dispersion Analysis Secondary Electron Detector of Intal (Sodium Cromoglycate) Metered-Dose Inhalers... [Pg.376]

Secondary structures are currently the most useful structural elements with respect to computer analysis. Secondary structrures are mostly known for RNAs and proteins but they also play important roles in DNA. Potential secondary structures can be easily determined and even scored via the negative enthalpy that should be associated with the actual formation of the hairpin (single strand) or cruciform (double strand) structure. Secondary structures are also not necessarily conserved in primary nucleotide sequence but are subject to strong positional correlation within the structure. Three-dimensional aspects of DNA sequences are without any doubt very important for the functionality of such regions. However, existing attempts to calculate such structures in reasonable time met with mixed success and cannot be used for a routine sequence analysis at present. [Pg.132]

The transmission electron microscopy was done with a 100-kV accelerating potential (Hitachi 600). Powder samples were dispersed onto a carbon film on a Cu grid for TEM examination. The surface analysis techniques used, XPS and SIMS, were described earlier (7). X-ray photoelectron spectroscopy was done with a Du Pont 650 instrument and Mg K radiation (10 kV and 30 mA). The samples were held in a cup for XPS analysis. Secondary ion mass spectrometry and depth profiling was done with a modified 3M instrument that was equipped with an Extranuclear quadrupole mass spectrometer and used 2-kV Ne ions at a current density of 0.5 /zA/cm2. A low-energy electron flood gun was employed for charge compensation on these insulating samples. The secondary ions were detected at 90° from the primary ion direction. The powder was pressed into In foil for the SIMS work. [Pg.544]

Now we consider a mixture of four components benzene, ethylene, ethylbenzene and diethylbenzene. Figure 8.22B presents the equilibrium composition at a ratio of reactants 1 1 and 20 atm. The above picture changes considerably. The equilibrium conversion of benzene drops under 80%. The amount of ethyl-benzene at equilibrium drops also significantly, because of diethylbenzene. On the contrary, the temperature seems not to play a role. Hence, we must include in our analysis secondary reactions. The problem is that we would need kinetic data to assess the selectivity. [Pg.336]

Generally, AES systems are calibrated with multi-element standard samples. In the case of sparks, arcs, glow discharges, and laser ablation, solid samples are required, which are rarely available in large enough numbers to provide a satisfactory calibration. Hence, in solid sample analysis secondary standards are usually prepared. [Pg.489]

In order to adequately treat dependent failures in a reliability analysis, secondary failures (1) and failures of components due to functional dependencies (2) are accounted for as far as possible by a detailed fault tree model. Common cause failures (3) require a separate treatment. The procedure for aU three failure types is explained below. Yet, before that possible causes of dependent failures are classified. [Pg.379]

For atmospheric analysis, secondary or working standards are normally analyzed alongside real samples and are used to monitor daily or longer-term changes in instrument response. These standards are typically large-volume, high-pressure air samples, which are calibrated against primary standards before and after use. As both primary... [Pg.652]

See alsa Mass Spectrometry Overview Electrospray Peptides and Proteins. Surface Analysis Secondary Ion Mass Spectrometry of Poiymers. [Pg.2826]

See also Atomic Mass Spectrometry Inductively Coupled Plasma Laser Microprobe. Gas Chromatography Mass Spectrometry. Liquid Chromatography Liquid Chromatography-Mass Spectrometry. Mass Spectrometry Ionization Methods Overview Atmospheric Pressure Ionization Techniques Electrospray Liquid Secondary Ion Mass Spectrometry Matrix-Assisted Laser Desorption/ionization. Surface Analysis Secondary Ion Mass Spectrometry of Polymers Laser Ionization. [Pg.2865]

See MASS SPECTROMETRY Liquid Secondary Ion Mass Spectrometry. SURFACE ANALYSIS Secondary Ion Mass Spectrometry of Polymers... [Pg.4343]

SURFACE ANALYSIS/Secondary Ion Mass Spectrometry of Polymers... [Pg.4660]

SURFACE ANALYSIS/Secondary Neutral Mass Spectrometry... [Pg.4670]

SIMS (Quadrupole) Quadrupole Sims Dopant and impurity depth profiling, surface and microanalysis, insulator analysis Secondary ions 10 -10 atoms <50 A <5 pm (imaging) >30 pm (depth profiling)... [Pg.152]


See other pages where Secondary analyses is mentioned: [Pg.270]    [Pg.600]    [Pg.270]    [Pg.246]    [Pg.270]    [Pg.122]    [Pg.453]    [Pg.607]    [Pg.254]    [Pg.228]    [Pg.8]    [Pg.420]    [Pg.2213]    [Pg.2213]    [Pg.2213]    [Pg.4670]   
See also in sourсe #XX -- [ Pg.272 ]




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Fault Tree Analysis Primary-Secondary-Command

Lysozyme, secondary structure analysis

Myoglobin secondary structure analysis

Proteomic analysis secondary/tertiary structure

Qualitative analysis of secondary hydrocarbon migration systems

Quantitative analysis of secondary hydrocarbon migration systems

Secondary Ion Mass Spectrometry for Surface Analysis

Secondary ion mass spectrometry SIMS) analysis

Secondary lipid analysis

Secondary quantitative analysis

Secondary reaction analysis

Secondary structure analysis

Secondary trace analysis

Sequence Alignments With Primary and Secondary Structure Analysis

Surface analysis secondary electron microscopy-energy

Surface analysis secondary ion mass spectrometry

Surface analysis secondary neutral mass spectroscopies

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