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Surface reflectance

Although the size separation/classification methods are adequate in some cases to produce a final saleable mineral product, in a vast majority of cases these produce Httle separation of valuable minerals from gangue. Minerals can be separated from one another based on both physical and chemical properties (Fig. 8). Physical properties utilized in concentration include specific gravity, magnetic susceptibility, electrical conductivity, color, surface reflectance, and radioactivity level. Among the chemical properties, those of particle surfaces have been exploited in physico-chemical concentration methods such as flotation and flocculation. The main objective of concentration is to separate the valuable minerals into a small, concentrated mass which can be treated further to produce final mineral products. In some cases, these methods also produce a saleable product, especially in the case of industrial minerals. [Pg.401]

No object can radiate more energy than can a blackbody at the same temperature, because a blackbody ia equiUbrium with a radiation field at temperature T radiates exacdy as much energy as it absorbs. Any object exhibiting surface reflection must have emissivity of less than 1. Pyrometers are usually caUbrated with respect to blackbodies. This can cause a serious problem ia use. The emissivities of some common materials are fisted ia Table 4. [Pg.404]

An additional surface arrangement of importance is a single-zone surface enclosing gas. With the gas assumed gray, the simplest derivation of GSi is to note that the emission from surface Ai per unit of its blackbody emissive power is Ai i, of which the fractions g and (1 - G)ei are absorbed Dy the gas and the surface, respectively, and the surface-reflected residue always repeats this distribution. Therefore,... [Pg.583]

For simplicity, n should be as low as is consistent with small error. The retention of but two terms is feasible when one considers that if Otci is so fitted that the first absorption and the second following surface reflec tion are correct, then further attenuation of the beam by successive surface reflections makes the errors in those absorptions decrease in importance. Let the gas be modeled as the sum of one gray gas plus a clear gas, with the gray gas occupying the energy frac tion a of the blackbody spectrum and the clear gas the frac tion (1 — ). Then... [Pg.583]

There is no Kerr rotation or Kerr ellipticity for pure /flight or for mixed r- and p-light in the transverse geometry, but there is a magnetization induced change in the surface reflectivity. [Pg.728]

A planar polished surface reflects heat radiation in a similar manner with which it reflects light. Rough surfaces reflect energy in a diffuse manner hence radiation is reflected in all directions. A blackbody absorbs all incoming radiation and therefore has no reflection. A perfect blackbody does not exist a near perfect blackbody surface such as soot reflects 5% of the radiation, making it the standard for an ideal radiator. [Pg.106]

The decision diagram in Figure 9.6 shows that the energy has to be determined in this case from thermodynamic data. This exercise was performed in Section 9.2.2, so it will not be repeated here. For the almost filled vessel, it was found that E = 1140.8 MJ, and, for the almost empty vessel, E = 372.8 Ml was found. However, these values were calculated in order to determine blast for a vessel placed at grade level a factor of 2 was applied to account for surface reflection. This factor should not be applied in determining available internal energy. Therefore, the available internal energy for the 80% filled vessel is... [Pg.331]

Figure 3. Surface Reflectance of Lemons from Five Different Color Grades... Figure 3. Surface Reflectance of Lemons from Five Different Color Grades...
The function of an antireflection (AR) coating is to reduce the surface reflection of optical elements and increase the amount of light transmitted. The glare and ghost images from secondary reflections are minimized. Multiple coatings are now produced that can... [Pg.406]

Global planeness and large scale scratches are usually evaluated by HDI instruments as shown in Fig. 3(a) [8], which is a surface reflectance analyzer to measure flatness, waviness, roughness of a surface, and observe scratches (Fig. 3(h)), pits (Fig. 3(c)), particles (Fig. 3(d)) on a global surface. These surface defects can also be observed by SEM, TEM, and AFM. Shapes of slurry particles can be observed by SEM and TEM, and their movement in liquid by the fluorometry technique as shown in Chapter2. [Pg.237]

Fig. 3—Measurement of surface by HDI surface reflectance analyzer. In electromagnetic radiation (light), the polarization direction is defined as the direction of the electric field vector. The incident polarization of the light can be controlled. The instrument uses a variety of detectors to analyze the reflected polarization state of the light. (U.S. Patent 6,134,011). (a) Plane of the disk The SRA uses a fixed 60 degree (from the surface normal) angle of incidence. The plane of incidence is the same as the paper plane (b) Pit on a surface detected by reflected light channels of HDI instrument (c) Scratches on disk surface measured by HDI surface reflectance analyzer (d) Particles on the surface of disk detected by reflected light (black spot) and by scattered light (white spot) [8]. Fig. 3—Measurement of surface by HDI surface reflectance analyzer. In electromagnetic radiation (light), the polarization direction is defined as the direction of the electric field vector. The incident polarization of the light can be controlled. The instrument uses a variety of detectors to analyze the reflected polarization state of the light. (U.S. Patent 6,134,011). (a) Plane of the disk The SRA uses a fixed 60 degree (from the surface normal) angle of incidence. The plane of incidence is the same as the paper plane (b) Pit on a surface detected by reflected light channels of HDI instrument (c) Scratches on disk surface measured by HDI surface reflectance analyzer (d) Particles on the surface of disk detected by reflected light (black spot) and by scattered light (white spot) [8].
Johnson, D.A., Richards, R.A. Turner, N.C. (1983). Yield, water relations and surface reflectances of near-isogenic wheat lines differing in glaucousness. Crop Science, 23, 318-25. [Pg.153]

The Figure 5 shows the case of absorption of light through an optical filter and includes other processes that decrease the transmittance such as surface reflectance and scattering. [Pg.82]

The contaminants present in the aquatic environment consist of both inorganic and organic compounds. Their interactions with the colloidal, mineral and coated particle surfaces reflect the nature of these hydrophilic and lipophilic attractions. [Pg.365]

Figure 3.1 Schematic diagram of an AAS spectrometer. A is the light source (hollow cathode lamp), B is the beam chopper (see Fig. 3.2), C is the burner, D the monochromator, E the photomultiplier detector, and F the computer for data analysis. In the single beam instrument, the beam from the lamp is modulated by the beam chopper (to reduce noise) and passes directly through the flame (solid light path). In a double beam instrument the beam chopper is angled and the rear surface reflective, so that part of the beam is passed along the reference beam path (dashed line), and is then recombined with the sample beam by a half-silvered mirror. Figure 3.1 Schematic diagram of an AAS spectrometer. A is the light source (hollow cathode lamp), B is the beam chopper (see Fig. 3.2), C is the burner, D the monochromator, E the photomultiplier detector, and F the computer for data analysis. In the single beam instrument, the beam from the lamp is modulated by the beam chopper (to reduce noise) and passes directly through the flame (solid light path). In a double beam instrument the beam chopper is angled and the rear surface reflective, so that part of the beam is passed along the reference beam path (dashed line), and is then recombined with the sample beam by a half-silvered mirror.
FIAs can be based on steady-state intensity measurements without probe amplification, owing to the sensitivity of detection that is possible with fluorescence instrumentation, which exceeds that of spectrophotometers by two or three orders of magnitude. A sensitive fluorometer has been described for an estradiol assay(36) in which the limit of estradiol detection is 3 x KT11 M. Estradiol antibody labeled with rhodamine B is reacted with estradiol samples. Unreacted labeled antibody is removed with Sepharose-estradiol-casein beads, and the remaining fluorescence is directly proportional to the analyte concentration. The detection limit of rhodamine B on the same fluorometer is 5 x 1(T12 M. This instrument uses a 0.75 mW green helium-neon (HeNe) laser to irradiate the sample from above, at the air-liquid interface, to increase the light path and to decrease surface reflections. The sample compartment has a top-mounted photon trap, and a mirror mounted on the side of the sample compartment opposite the PMT to enhance detection. [Pg.460]


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Anti-reflective surfaces

Attenuated total reflectance infrared surface species, study

Attenuated total reflectance surface-enhanced

Attenuated total reflectance surface-enhanced infrared absorption spectroscopy

Attenuated total reflection surface plasmon waves

Bubble surface, particle reflection

Crystal surface reflectivity

Differential surface reflection

Diffuse reflectance laser flash-photolysis surface studies

Diffuse reflectance techniques, surface

Diffuse reflectance techniques, surface photochemistry studies

Equilibrium constant surface reflecting

Front-surface reflectance

Front-surface reflection

Front-surface reflection effect

High-reflection surfaces

Highly reflective mirror surface roughness

Measured surface reflections

Metal surface, external reflection

Metal surfaces, reflectivity

Neutron reflectivity surface

Neutron reflectivity surface layer thickness

Neutron reflectivity surface roughness

Particle reflection from a bubble surface

Plastic surfaces, reflectance spectroscopy

Polished surfaces reflectivity

Polymer Surfaces reflectance-transmittance

Polymers at Surfaces-Reflection

Reflectance Techniques for Surface Photochemistry Studies

Reflecting surface

Reflection and refraction at a plane surface

Reflection coefficient of the surface

Reflection from Ceramic Surfaces

Reflection from a surface

Reflection high-energy electron diffraction surface structure

Reflection interference microscopy surface topography

Reflection of the Blast Wave at a Surface

Reflection surfaces

Reflections, reducing with surface coatings

Reflectivity from free surface showing

Reflectivity of polished surfaces

Reflectivity surface structure

Reflectivity surface-bulk system

Siliceous surface, variable-temperature diffuse reflectance Fourier transform

Single-surface reflectance

Surface Reflectance Infrared Spectroscopy (SRIRS)

Surface absorption-reflection

Surface characterization reflectance techniques

Surface differential reflectivity

Surface differential reflectivity (SDR

Surface enhanced infrared reflection spectrometry

Surface phenomena internal reflection

Surface reflectance infrared spectroscopy

Surface reflection amplitude

Surface reflectivity

Surface reflectivity

Surface specular reflectivity

Surface total reflection excitation

Surface vibrational spectroscopy reflection-absorption infrared spectra

Surface-reflected energy

Surfaces reflection high-energy electron diffraction

Surfaces, reflectance spectroscopy

Surfaces, studies attenuated total internal reflection

Total internal reflectance fluorescence surface plasmon

Total internal reflection surface-enhanced

Total internal reflection surface-enhanced Raman scattering

UV-visible Reflectance Spectroscopy of Thin Organic Films at Electrode Surfaces

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