Surface enhanced infrared reflection spectrometry

Techniques that have been applied include time of flight static secondary ion mass spectrometry (SSIMS)/ " low energy ion scattering spectromehy, x-ray photoelectron microscopy scanning electrochemical microscopy (SECM), laser ionization mass spectrometry, surface enhanced infrared reflection spectroscopy, Fourier Transform infrared spechoscopy and nuclear magnetic resonance spectroscopy. ... [Pg.158]

This time-resolved measurement method can be applicable to relatively slow transient phenomena, as its time-resolved measurements are undertaken while the movable mirror is at rest. The number of applications of step-scan FT-IR spectrometry to time-resolved measurements currently is more than that by any other method, and it has been applied to various studies in many fields such as studies of biomolecules, liquid crystals, polymers, photochemical reactions in zeolites, oxidation-reduction reactions on electrode surfaces, and excited electronic states of inorganic complexes. Further, this method has been applied to time-resolved measurements in combination with attenuated total reflection (ATR) (see Chapter 13), surface-enhanced infrared absorption (see Section 13.2.2) [10, 11], infrared microscopic measurements (see Chapter 16) [12], and infrared spectroscopic imaging (see Chapter 17) [13]. [Pg.293]