Reflection high-energy electron diffraction surface structure

RHEED Reflection high-energy electron diffraction [78, 106] Similar to HEED Surface structure, composition... 

Ichimiya A, Ohno Y and Horio Y 1997 Structural analysis of crystal surfaces by reflection high energy electron diffraction Surf. Rev. Left 4 501-11... 

This chapter contains articles on six techniques that provide structural information on surfaces, interfeces, and thin films. They use X rays (X-ray diffraction, XRD, and Extended X-ray Absorption Fine-Structure, EXAFS), electrons (Low-Energy Electron Diffraction, LEED, and Reflection High-Energy Electron Diffraction, RHEED), or X rays in and electrons out (Surfece Extended X-ray Absorption Fine Structure, SEXAFS, and X-ray Photoelectron Diffraction, XPD). In their usual form, XRD and EXAFS are bulk methods, since X rays probe many microns deep, whereas the other techniques are surfece sensitive. There are, however, ways to make XRD and EXAFS much more surfece sensitive. For EXAFS this converts the technique into SEXAFS, which can have submonolayer sensitivity. 

Alternatives to XRD include transmission electron microscopy (TEM) and diffraction, Low-Energy and Reflection High-Energy Electron Diffraction (LEED and RHEED), extended X-ray Absorption Fine Structure (EXAFS), and neutron diffraction. LEED and RHEED are limited to surfaces and do not probe the bulk of thin films. The elemental sensitivity in neutron diffraction is quite different from XRD, but neutron sources are much weaker than X-ray sources. Neutrons are, however, sensitive to magnetic moments. If adequately large specimens are available, neutron diffraction is a good alternative for low-Z materials and for materials where the magnetic structure is of interest. 

In the process of MBE, the surface structure can be investigated by reflected high energy electron diffraction (RHEED). During MBE growth, one often observes an oscillation in the intensity of the specular reflected beam as a function of time. This is interpreted to be due to the layer-by-layer growth of a two-dimensional island. 

Rutherford Backscattering Spectroscopy Reflection High-Energy Electron Diffraction Scanning Electron Microscopy Surface (Sensitive) Extended X-Ray Absorption Fine Structure... 

The surface and the bulk PSC crystal quality was studied by reflection high-energy electron diffraction (RHEED) and X-ray diffraction (XRD). Surface chemical compositions were determined with Auger electron spectroscopy (AES) and secondary-ion mass spectrometry (SIMS). Atomic force microscopy (AFM), transmission and scanning electron microscopy (TEM and SEM) were used to monitor PSC morphology and structure. 

E. Other techniques Low-energy electron diffraction Elastic low-energy electron diffraction Inelastic low-energy electron diffraction Reflection high-energy electron diffraction LEED ELEED ILEED RHEED 50 A Crystalline surface structure Limited applicability 128, 129, 130... 

Shigeta, Y. Fukaya, Y. (2004). Structural phase transition and thermal vibration of surface atoms studied by reflection high-energy electron diffraction. Applied Surface Science. Vol. 237, p. 21-28, ISSN 0169-4332... 

Typically, scattering techniques, such as low-energy electron diffraction (referred to as LEED), reflection high-energy electron diffraction (RHEED), X-ray scattering, etc., have been used extensively to determine the structure of surfaces (see, for... 

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