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Probe atomization

2 Probe Atomization, Probe atomization is an alternative approach to achieve high vapour temperatures in the graphite furnace and isothermal atomization of the sample in order to minimize chemical interference effects in the determination of volatile elements. This technique was first suggested [Pg.76]

Two principal advantages of the probe atomization are (i) Improved control of the vapour temperature the atoms experience (ii) Rapid heating of the atomization surface to the volatilization temperature of the analyte and matrix. A comparison of typical furnace programmes for wall/platform atomization and probe atomization is given in Table 8. The probe is not in [Pg.78]


Although MAS is very widely applied to non-integer spin quadnipolar nuclei to probe atomic-scale structure in solids, such as distinguishing AlO and AlOg enviromnents [21], simple MAS about a single axis caimot produce a completely averaged isotropic spectrum. As the second-order quadnipole interaction contains both... [Pg.1484]

Other techniques in which incident photons excite the surface to produce detected electrons are also Hsted in Table 1. X-ray photoelectron Spectroscopy (xps), which is also known as electron spectroscopy for chemical analysis (esca), is based on the use of x-rays which stimulate atomic core level electron ejection for elemental composition information. Ultraviolet photoelectron spectroscopy (ups) is similar but uses ultraviolet photons instead of x-rays to probe atomic valence level electrons. Photons are used to stimulate desorption of ions in photon stimulated ion angular distribution (psd). Inverse photoemission (ip) occurs when electrons incident on a surface result in photon emission which is then detected. [Pg.269]

Other excellent methods of phase identification include TEM and electron diffraction. These may be more useful for low-Z materials, ultrathin films, and for characterizing small areas, including individual grains. For multiphase films with incomplete texture, these methods and XRD are complementary, since in commonly used geometries, they probe atomic planes perpendicular and parallel to the thin film surface, respectively. [Pg.206]

Surface forces measurement directly determines interaction forces between two surfaces as a function of the surface separation (D) using a simple spring balance. Instruments employed are a surface forces apparatus (SFA), developed by Israelachivili and Tabor [17], and a colloidal probe atomic force microscope introduced by Ducker et al. [18] (Fig. 1). The former utilizes crossed cylinder geometry, and the latter uses the sphere-plate geometry. For both geometries, the measured force (F) normalized by the mean radius (R) of cylinders or a sphere, F/R, is known to be proportional to the interaction energy, Gf, between flat plates (Derjaguin approximation). [Pg.2]

FIG. 1 Schematic drawings of (a) the surface forces apparatus and (b) the colloidal probe atomic force microscope. [Pg.3]

Typical forces profdes measmed between glass surfaces in ethanol-cyclohexane mixtures are shown in Fig. 2. Colloidal probe atomic force microscopy has been employed. In pure cyclohexane, the observed force agrees well with the conventional van der Waals attraction calculated with the nometarded Hamaker constant for glass/cyclohexane/glass. [Pg.3]

A widely used 3-D QSAR method that makes use of PLS is comparative molecular field analysis (CoMFA), in which a probe atom is used to calculate the steric and electronic fields at numerous points in a 3D lattice within which the molecules have been aligned. Poso et al. [56] used the technique to model the binding of coumarins to cytochrome P450 2A5, with similar results to those obtained by Bravi and Wikel [55]. Shi et al. [57] used it to model the estrogen receptor binding of a large diverse set of compounds, and Cavalli et al. [58] used it to develop a pharmacophore for hERG potassium... [Pg.480]

Knowledge on the plasma species can be obtained by the use of plasma diagnostics techniques, such as optical emission spectroscopy (OES) and mass spectroscopy (MS). Both techniques are able to probe atomic and molecular, neutral or ionized species present in plasmas. OES is based on measuring the light emission spectrum that arises from the relaxation of plasma species in excited energy states. MS, on the other hand, is generally based on the measurement of mass spectra of ground state species. [Pg.236]

Channelling. When the incoming beam is aligned with any low-index axis or plane in a crystal it can be channelled, so that the probe atoms are steered down the channels. Under these conditions the backscattering yield will decrease to a few percent of its original non-oriented value (the random yield ). [Pg.92]

Wold DV, Haag R, Rampi MA, Frisbie CD (2002) Distance dependence of electron tunneling through self-assembled monolayers measured by conducting probe atomic force microscopy unsaturated versus saturated molecular junctions. J Phys Chem B 106 2813-2816... [Pg.114]

Nayak, K. P. Melentiev, P. N. Morinaga, M. Kien, F. F. Balykin, V. I. Hakuta, K., Optical nanofiber as an efficient tool for manipulating and probing atomic Fluorescence, Opt. Express... [Pg.373]

Janssens et al. [38, 40] used photoemission of adsorbed noble gases to measure the electrostatic surface potential on the potassium-promoted (111) surface of rhodium, to estimate the range that is influenced by the promoter. As explained in Chapter 3, UPS of adsorbed Xe measures the local work function, or, equivalently, the electrostatic potential of adsorption sites. The idea of using Kr and Ar in addition to Xe was that by using probe atoms of different sizes one could vary the distance between the potassium and the noble gas atom. Provided the interpretation in terms of Expression (3-13) is permitted, and this is a point the authors checked [38], one thus obtains information about the variation of the electrostatic potential around potassium promoter atoms. [Pg.262]

Applications of local HSAB principle have been used for the determination of the softer regions in Si clusters by using Ga as probe atom [30a], or the site for H-atom adsorption on Si clusters. In the latter case, the isomer predicted by the Fukui function was found but it is not always the most stable one. The use of the reactivity indices is only valid when the adsorption process does not induce strong deformation of the cluster [30b]. [Pg.174]

G. Gillies, C.A. Prestidge, and P. Attard Determination of the Separation in Colloid Probe Atomic Force Microscopy of Deformable Bodies. Langmuir 17, 7955 (2001). [Pg.103]

Another class of 3D descriptors is molecular interaction field (MIF) descriptors, with its well-known example of Comparative Molecular Field Analysis (204,205) (CoMFA). In CoMFA, the steric and electrostatic fields are calculated for each molecule by interaction with a probe atom at a series of grid points surrounding the aligned molecules in 3D space. These interaction energy fields are correlated with the property of interest. The 3D nature of the CoMFA technique provides a convenient tool for visualization of the significant features of the resulting models. [Pg.474]

In 1910 Rutherford wrote to a friend, I think I can devise an atom much superior to J.J. s, for the explanation of and stoppage of alpha and beta particles, and at the same time I think it will fit in extraordinary well with the experimental numbers. Rather than devise a model of the atom based on theoretical ideas as Thomson had done, Rutherford intended to probe atomic structure by bombarding atoms with particles ejected from radioactive atoms. Rutherford felt that experimental physics was the only real physics and that by performing experiments he could gain greater insight into atomic structure than Thomson had been able to get using only theory. [Pg.182]

Loiacono MJ, Granstrom EL, Frisbie CD (1998) Investigation of charge transport in thin, doped sexithiophene crystals by conducting probe atomic force microscopy. J Phys Chem B 102 1679-1688... [Pg.234]

More recently, an alternative technique has been developed. The use of probe atomization became popular in the mid-1980s and has been shown to offer the same advantages as a platform. The sample is pipetted on to a graphite probe and the normal drying and ashing cycles are performed. The probe is then removed from the tube, which is then heated to the atomization temperature. When this has been done, the probe is re-introduced into the tube and is heated by the hot gas present, allowing the atoms to form in an isothermal atmosphere. [Pg.66]

On the other hand, SIMS takes advantage of the destructive nature of the ion probe. Atoms can be knocked free (sputtered) from the surface by the bombarding ions and those that become ionized are analyzed by conventional mass spectrometry I70). A large number of different kinds of ions can be emitted from the surface. The resolution is also quite good. Thus, although SIMS is not as surface sensitive as ISS, it does provide more detailed information about the surface chemistry. ISS and SIMS, therefore, complement one another. Furthermore, since the ion probe sputters away the surface that is being analyzed, the change in the chemistry of the surface as a function of depth below the surface can be studied by these techniques. [Pg.63]

More than one probe gas usually is used to study a given specimen because, as shown by Equation 1, the probe atomic mass cannot be less than the sample atomic mass, and the peak resolution decreases as the difference between these masses increases. Semi-quantitative data is received if the instrument is calibrated with samples of known surface composition. Qualitative data is available readily from using Equation 1. [Pg.396]


See other pages where Probe atomization is mentioned: [Pg.327]    [Pg.359]    [Pg.77]    [Pg.342]    [Pg.138]    [Pg.302]    [Pg.45]    [Pg.124]    [Pg.30]    [Pg.13]    [Pg.403]    [Pg.15]    [Pg.68]    [Pg.69]    [Pg.342]    [Pg.344]    [Pg.350]    [Pg.161]    [Pg.481]    [Pg.482]    [Pg.203]    [Pg.344]    [Pg.375]    [Pg.119]    [Pg.134]    [Pg.408]    [Pg.1068]    [Pg.327]    [Pg.46]   
See also in sourсe #XX -- [ Pg.77 , Pg.93 ]




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Atom Probe Studies of Semiconductor Materials

Atom and Molecule Probes

Atom probe

Atom probe

Atom probe atomic resolution

Atom probe by inner-shell ionization

Atom probe characteristics

Atom probe configurations

Atom probe field ion microscopy

Atom probe field ion microscopy APFIM)

Atom probe grain boundary analysis

Atom probe interface analysis

Atom probe microscopy

Atom probe position sensitive detection

Atom probe semiconductors

Atom probe specimen preparation

Atom probe surface reactions

Atom probe thin films

Atom probe tomography

Atom probe tomography (APT)

Atom probe tomography analysis

Atom-probe field ion microscope

Atomic Kelvin probe

Atomic conducting probe

Atomic force microscopy (AFM probe

Atomic force microscopy colloidal probe

Atomic force microscopy imaging probes

Atomic force microscopy local mechanical properties probe

Atomic force microscopy scanning probe instrument

Atomic probe

Atomic probe

Atomic systems probe absorption interference

Conducting-probe Atomic Force Microscopy

Conductive-probe atomic force microscope

Energy Compensated Atom Probe (ECAP)

Field-Ion Microscopy and the Atom Probe

Imaging atom-probe

Local electrode atom probe

Magnetic sector atom-probe

Microscopy position-sensitive atom probe

Position sensitive atom probe

Position-sensitive Atom Probe (POSAP)

Probe atomic force microscopy

Probing using atomic force microscopy

Pulsed laser atom probe

Pulsed-laser time-of-flight atom-probe

Scanning atom probe

Scanning probe techniques atomic force microscopy

The Conventional (One-Dimensional) Atom Probe

Three-dimensional atom probe

Time-of-flight atom probe

Tomographic atom probe

Wide-angle tomographic atom probe

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